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Schiavello, M., Ed.; NATO ASI Series C, Reidel Publishing Co.: Dordrecht, The Netherlands
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Memming, R. In Photoelectrochemistry, Photocatalysis and Photoreactors. Fundamentals and Developments; Schiavello, M., Ed.; NATO ASI Series C, Vol. 146; Reidel Publishing Co.: Dordrecht, The Netherlands, 1985. '
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7
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8
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0025493033
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Peter, L. M.; Borazio, A. M.; Lewerenz, H. J.; Stumper, J. J. Electroanal. Chem. 1990, 290, 229.
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Peter, L.M.1
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0027884971
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Erne, B. H.; Vanmaekelbergh, D.; Vermeir, I. E. Electrochim. Acta 1993, 38, 2559.
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Erne, B.H.1
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12
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0022025840
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van den Meerakker, J. E. A. M.; Kelly, J. J.; Notten, P. H. L. J. Electrochem. Soc. 1985, 132, 638.
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13
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0022128291
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Vanmaekelbergh, D.; Gomes, W. P.; Cardon, F. Ber. Bunsen-Ges. Phys. Chem. 1985, 89, 994.
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14
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0022722729
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15
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0023328161
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Vanmaekelbergh, D.1
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Cardon, F.3
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16
-
-
85085718311
-
-
note
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REC is the current density associated with electron-hole recombination (i.e., -e times the electron flux involved in recombination).
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-
-
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17
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-
0008473003
-
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Vermeir, I. E.; Vanden Kerchove, F.; Gomes, W. P. J. Electroanal. Chem. 1991, 313, 141.
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, vol.313
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Vermeir, I.E.1
Vanden Kerchove, F.2
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18
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0002574882
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Preusser, S.; Herlem, M.; Etcheberry, A.; Jaume, J. Electrochim. Acta 1992, 37, 289.
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, vol.37
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Preusser, S.1
Herlem, M.2
Etcheberry, A.3
Jaume, J.4
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19
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0003834545
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Eisevier: Oxford, U.K.
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Notten, P. H. L.; van den Meerakker, J. E. A. M.; Kelly, J. J. Etching of III-V Semiconductors, an Electrochemical Approach; Eisevier: Oxford, U.K., 1991.
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(1991)
Etching of III-V Semiconductors, An Electrochemical Approach
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Notten, P.H.L.1
Van Den Meerakker, J.E.A.M.2
Kelly, J.J.3
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21
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33645940142
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-
The symbols R and Q denote a resistor and a CPE, respectively. Parentheses indicate a parallel connection; hence (RQ) stands for the parallel connection of a resistor and a CPE.
-
The symbols R and Q denote a resistor and a CPE, respectively. Parentheses indicate a parallel connection; hence (RQ) stands for the parallel connection of a resistor and a CPE.
-
-
-
-
22
-
-
85085720419
-
-
note
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23
-
-
-
-
24
-
-
33645941421
-
-
note
-
H: Helmholtz-layer capacitance), the impedance element related to the photodissolution will stand in parallel to the CPE.
-
-
-
-
25
-
-
85085719898
-
-
note
-
s denote the density of CB electrons or VB holes at the surface, respectively, s is the density of recombination centers, and θ is their occupation number.
-
-
-
-
26
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0020099136
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Vanmaekelbergh, D.; Gomes, W. P.; Cardon, F. J. Eleclrochem. Soc. 1982, 729, 546.
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(1982)
J. Eleclrochem. Soc.
, vol.729
, pp. 546
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Vanmaekelbergh, D.1
Gomes, W.P.2
Cardon, F.3
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27
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0343415250
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Vanmaekelbergh, D.; Rigole, W.; Gomes, W. P. J. Chem. Soc., Faraday Trans. 1983, 79, 2813.
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(1983)
J. Chem. Soc., Faraday Trans.
, vol.79
, pp. 2813
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Vanmaekelbergh, D.1
Rigole, W.2
Gomes, W.P.3
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30
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0037623038
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Oskam, G.; Hoffman, P. M.; Schmidt, J. C.; Searson, P. C. J. Phys. Chem. 1996, 100, 1801.
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(1996)
J. Phys. Chem.
, vol.100
, pp. 1801
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-
Oskam, G.1
Hoffman, P.M.2
Schmidt, J.C.3
Searson, P.C.4
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31
-
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33645907740
-
-
Of course, the value of the capacitive peak is also limited by CH. However, this does not invalidate the argument since the observed additional capacitance is much less than CH
-
Of course, the value of the capacitive peak is also limited by CH. However, this does not invalidate the argument since the observed additional capacitance is much less than CH.
-
-
-
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32
-
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85085719380
-
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m)
-
m).
-
-
-
-
33
-
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85085718089
-
-
2 as the slowly oxidizing intermediate leads to somewhat different equations; the results for this case are summarized at the end of this section (eqs 33 and 34)
-
2 as the slowly oxidizing intermediate leads to somewhat different equations; the results for this case are summarized at the end of this section (eqs 33 and 34).
-
-
-
-
34
-
-
85085719667
-
-
note
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0, etc.
-
-
-
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36
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33645954153
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-
The symbol means "equal by definition"
-
The symbol means "equal by definition".
-
-
-
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37
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3743122596
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Oskam, G.; Hoffmann, P. M.; Searson, P. C. Phys. Rev. Lett. 1996, 76, 1521.
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(1996)
Phys. Rev. Lett.
, vol.76
, pp. 1521
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Oskam, G.1
Hoffmann, P.M.2
Searson, P.C.3
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38
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0343415248
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Oskam, G.; Schmidt, J. C.; Searson, P. C. J. Eleclrochem. Soc. 1996, 143, 2539.
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(1996)
J. Eleclrochem. Soc.
, vol.143
, pp. 2539
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Oskam, G.1
Schmidt, J.C.2
Searson, P.C.3
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39
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33645919197
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The quantity Z is defined as the sum of the squares of the relative errors between the measured and the predicted value of the reduced spectrum parameters: (Equation; Presented)
-
The quantity Z is defined as the sum of the squares of the relative errors between the measured and the predicted value of the reduced spectrum parameters: (Equation; Presented)
-
-
-
-
40
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85085718994
-
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mps in eq 31 equals 13.2/11.6 for m = 4 and 13.2/12.4 for m = 5
-
mps in eq 31 equals 13.2/11.6 for m = 4 and 13.2/12.4 for m = 5.
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