Morphology, interface polarity and branching of electrochemically etched pores in InP

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 15, 2005, Pages 2950-2962

  Spiecker, E ^a   Rudel, M ^a   Jager W ^a   Leisner, M ^a   Foil H ^a  

^a UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED); ELECTROCHEMICAL ETCHING; INTERCONNECTED TETRAHEDRONS; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); CRYSTAL POLARITIES; FABRICATION OF PHOTONIC CRYSTALS; MEAN PORE DIAMETERS; PREFERENTIAL ORIENTATION; SURFACE PASSIVATION; TRANSITION REGIONS; TRIANGULAR CROSS-SECTIONS;

CRYSTAL LATTICES; ELECTROCHEMISTRY; ELECTRON DIFFRACTION; PHOTONS; SELF ASSEMBLY; TRANSMISSION ELECTRON MICROSCOPY; LANTHANUM COMPOUNDS; PASSIVATION;

SEMICONDUCTING INDIUM PHOSPHIDE; MORPHOLOGY;

EID: 29744470641     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200521098     Document Type: Article

References (25)

1. V. Lehmann and H. Föil, J. Electrochem. Soc. 137, 653 (1990).
2. V. Lehmann and U. Gösele, Appl. Phys. Lett. 58, 856 (1991).
3. T. Baba and M. Koma, Jpn. J. Appl. Phys. 34, 1405 (1995).
4. R. B. Wehrspohn, J. Schilling, J. Choi, Y. Luo, S. Matthias, S. Schweizer, F. Müller, U. Gösele, S. Lölkes, S. Langa, J. Carstensen, and H. Föll, in: Photonic Crystals: Advances in Design, Fabrication, and Characterization, edited by K. Busch, S. Lölkes, R. Wehrspohn, and H. Föll (Wiley-VCH, Weinheim, 2004).
5. H. Föll, S. Langa, J. Carstensen, M. Christophersen, and I. M. Tiginyanu, Adv. Mater. 15, 183 (2003).
6. E. Kikuno, M. Amitti, T. Takizawa, and S. Arai, Jpn. J. Appl. Phys. 34,177 (1995).
7. I. M. Tiginyanu, I. V. Kravetsky, S. Langa, G. Marowsky, J. Monecke, and H. Föll, phys. stat. sol. (a) 197(2), 549 (2003).
8. H. Fujikura, A. Liu. A. Hamamatsu, T. Sato, and H. Hasegawa, Jpn. J. Appl. Phys. 39, 4616 (2000).
9. M. A. Stevens-Kalceff, I. M. Tiginyanu, S. Langa, and H. Föll, J. Appl. Phys. 89(5), 560 (2001).
10. S. Langa, M. Christophersen, J. Carstensen, I. M. Tiginyanu, and H. Föll, phys. stat. sol. (a) 197(1), 77 (2003).
11. A. Hamamatsu, C. Kaneshiro, H. Fujikura, and H. Hasegawa, J. Electroanal. Chem. 473, 223 (1999).
12. S. Langa, S. Lölkes, J. Carstensen, M. Hermann, G. Böttger, I. M. Tiginyanu, and H. Fö;ll, phys. stat. sol. (c) 2(9), 3253 (2005).
13. T. Takizawa, S. Arai, and M. Nakahara, Jpn. J. Appl. Phys. 33, L643 (1994).
14. C. Jäger, C. Dieker, W. Jäger, M. Christophersen, J. Carstensen, and H. Föll, Inst. Phys. Conf. Ser. 164, 507 (1999).
15. C. Jäger, B. Finkenberger, W. Jäger, M. Christophersen, J. Carstensen, and H. Föll, Mater. Sci. Eng. B 69/70, 199 (2000).
16. E. Spiecker, C. Jäger, H. Lu, and W. Jäger, Inst. Phys. Conf. Ser. 180, 233 (2003).
17. E. Spiecker, C. Jäger, H. Lu, and W. Jäger, Microsc. Microanal. 9(3), 94 (2003).
18. J. Taftoe and J. C. H. Spence, J. Appl. Cryst. 15, 60 (1982).
19. E. Spiecker, Ultramicroscopy 92, 111 (2002).
20. C. Jäger, W. Jäger, J. Pöpping, G. Bösker, and N. A. Stolwijk, Philos. Mag. Eng. A 80, l (2000).
21. C. Jäger, E. Spiecker, J.-P. Morniroli, and W. Jäger, Ultramicroscopy 92, 273 (2002).
22. C. Jäger, E. Spiecker, and W. Jäger, Microsc. Microanal. 9(3), 296 (2003).
23. J. Carstensen, M. Christophersen, G. Hasse, and H. Föll, phys. stat. sol. (a) 182(1), 63 (2000).
24. H. Föll, J. Carstensen, M. Christophersen, and G. Hasse, phys. stat. sol. (a) 182(1), 7 (2000).
25. S. Langa, J. Carstensen, I. M. Tiginyanu, M. Christophersen, and H. Föll, Electrochem. Solid-State Lett. 5, 14 (2002).