In situ electrochemical characterization of porous n-InP (100)

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 6, 2007, Pages 1898-1902

  Santinacci, L ^a   Goncalves A M ^a   David, C ^a   Eb, A ^a   Gerard, I ^a   Mathieu, C ^a   Herlem, M ^a   Etcheberry, A ^a  

^a UNIVERSITÉ DE VERSAILLES SAINT QUENTIN EN YVELINES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED SURFACE; DEAD LAYERS; ELECTROCHEMICAL CHARACTERIZATIONS; ELECTROCHEMICAL INVESTIGATIONS; FLAT BAND POTENTIAL; IN-SITU; PHOTOCURRENT SPECTRUM; PORE FORMATIONS; PORE MORPHOLOGY; POROUS ETCHING; POROUS FILMS; POROUS STRUCTURES;

CEMENTS; DISSOLUTION; ELECTRONIC STRUCTURE; IMAGING TECHNIQUES; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; PHOTOCURRENTS; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SURFACE CHEMISTRY; SURFACE MORPHOLOGY; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE ANALYSIS;

EID: 49749109486     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200674314     Document Type: Conference Paper

References (20)

1. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
2. T. Takizawa, S. Arai, and M. Nakahara, Jpn. J. Appl. Phys. Part 2 33, L643 (1994).
3. U. Schlierf, D. J. Lockwood, M. J. Graham, and P. Schmuki, Electrochim. Acta 49, 1743 (2004).
4. A. Hamamatsu, C. Kaneshiro, H. Fujikura, and H. Hasegawa, J. Electroanal. Chem. 473, 223 (1999).
5. P. Schmuki, L. Santinacci, T. Djenizian, and D. J. Lockwood, phys. stat. sol. (a) 182, 51 (2000).
6. H. Foll, S. Langa, J. Carstensen, M. Christophersen, and I. M. Tiginyanu, Adv. Mater. 15, 183 (2003).
7. G. Su, Q. Guo, and R. E. Palmer, J. Appl. Phys. 94, 7598 (2003).
8. D. Vanmaekelbergh and P. C. Searson, J. Electrochem. Soc. 141, 697 (1994).
9. L. M. Peter, D. J. Riley, and R. I. Wielgosz, Appl. Phys. Lett. 66, 2355 (1995).
10. B. H. Erne, F. Ozanam, and J.-N. Chazalviel, J. Phys. Chem. B 104, 11591 (2000).
11. E. A. Ponomarev and L. M. Peter, J. Electroanal. Chem. 396, 219 (1995).
12. H. Erne, D. Vanmaekelbergh, and I. E. Vermeir, Electrochim. Acta 38, 2559 (1993).
13. J. J. Kelly, E. S. Kooij, and D. Vanmaekelbergh, Langmuir 15, 3666 (1999).
14. Y. Nakato, K. Morita, and H. Tsubomura, J. Phys. Chem. 90, 2718 (1986).
15. B. Ren, F. M. Liu, J. Xie, B. W. Mao, Y. B. Zu, and Z. Q. Tian, Appl. Phys. Lett. 72, 933 (1998).
16. B. H. Erne, D. Vanmaekelbergh, and J. J. Kelly, J. Electrochem. Soc. 143, 305 (1996).
17. B. Erne, C. Mathieu, J. Vigneron, A. Million, and A. Etcheberry, J. Electrochem. Soc. 147, 3759 (2000).
18. S. Langa, I. M. Tiginyanu, J. Carstensen, M. Christophersen, and H. Foll, Electrochem. Solid State Lett. 3, 514 (2000).
19. G. Hollinger, E. Bergignat, J. Joseph, and Y. Robach, J. Vac. Sci. Technol. A 3, 2082 (1985).
20. A. O. Konstantinov, C. I. Harris, and E. Janzen, Appl. Phys. Lett. 65, 2699 (1994).