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Volumn 21, Issue 2, 2009, Pages 1609-1615
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Chemical bonding configurations at the interface of SiO2/Si(111)
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Author keywords
Nano transistor; Surface and Interface states; Synchrotron radiation technique; Thin film
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Indexed keywords
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EID: 63849093506
PISSN: 09707077
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (8)
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References (19)
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