Influence of steering effects on strain detection in AlGaInN/GaN heterostructures by ion channelling

Journal of Physics D: Applied Physics

Volumn 42, Issue 6, 2009, Pages

  Redondo Cubero, A ^a,b   Lorenz, K ^c   Franco, N ^c   Fernndez Garrido, S ^a   Gago, R ^b,d   Smulders, P J M ^e   Muoz E ^a   Calleja, E ^a   Alves, E ^c  

^a UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

^b CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^c INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^d INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^e UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION RANGES; CRITICAL PARAMETERS; GAN SUBSTRATES; HETEROSTRUCTURE; HETEROSTRUCTURES; HIGH RESOLUTION X-RAY DIFFRACTIONS; ION CHANNELLING; LATTICE-MATCHED; MONTE CARLO SIMULATIONS; PROBING BEAMS; STEERING EFFECTS; STRAIN DETECTIONS;

CRYSTALS; GALLIUM ALLOYS; GALLIUM NITRIDE; HETEROJUNCTIONS; MONTE CARLO METHODS; SEMICONDUCTING GALLIUM; X RAY DIFFRACTION;

IONS;

EID: 63749102128     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/6/065420     Document Type: Article

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