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Analytical and Bioanalytical Chemistry

Volumn 393, Issue 8, 2009, Pages 1889-1898

Investigation of polymer thin films by use of Bi-cluster-ion-supported time of flight secondary ion mass spectrometry

(2) Straif, Christoph J a,b Hutter, Herbert a,b

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

b INSTITUTE FOR MICROELECTRONICS (Austria)

Author keywords

Bi cluster ions; G SIMS; Polymer; Signal enhancement; ToF SIMS

Indexed keywords

ANALYSIS OF POLYMERS; BASIC PRINCIPLES; BI CLUSTER IONS; CLUSTER ION SIZES; FRAGMENTATION PATTERNS; G-SIMS; MASS SPECTRUM; ORGANIC FRAGMENTS; POLIES (METHYLMETHACRYLATE); POLY(4 VINYLPHENOL); POLYMER THIN FILMS; PRIMARY IONS; SECONDARY IONS; SIGNAL ENHANCEMENT; STATIC SECONDARY ION MASS SPECTROMETRIES; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRIES; TOF-SIMS;

DATA REDUCTION; ESTERS; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; IONS; MASS SPECTROMETERS; PLASTIC FILMS; POLYMER FILMS; POLYMERS; SECONDARY EMISSION; SPECTROMETRY; SPECTRUM ANALYSIS; THIN FILMS;

SECONDARY ION MASS SPECTROMETRY;

POLY(4 VINYLPHENOL); POLY(4-VINYLPHENOL); POLY(METHYL METHACRYLATE); POLYVINYL DERIVATIVE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; MASS SPECTROMETRY; METHODOLOGY; TIME;

MEMBRANES, ARTIFICIAL; POLYMETHYL METHACRYLATE; POLYVINYLS; SPECTROMETRY, MASS, SECONDARY ION; TIME FACTORS;

EID: 63449099440 PISSN: 16182642 EISSN: 16182650 Source Type: Journal
DOI: 10.1007/s00216-009-2624-0 Document Type: Article

Times cited : (8)

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