Analysis of metastable ions in the ToF-SIMS spectra of polymers

International Journal of Mass Spectrometry

Volumn 269, Issue 1-2, 2008, Pages 85-94

  Shard, A G ^a   Gilmore, I S ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Secondary ion mass spectrometry; Surface analysis

Indexed keywords

EID: 36549006544     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2007.09.011     Document Type: Article

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