Imaging G-SIMS: A novel bismuth-manganese source emitter

Rapid Communications in Mass Spectrometry

Volumn 22, Issue 16, 2008, Pages 2602-2608

  Green, Felicia M ^a   Kollmer, Felix ^b   Niehuis, Ewald ^b   Gilmore, Ian S ^a   Seah, Martin P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; ION BEAMS; ION SOURCES; MANGANESE; METAL IONS;

CONDITION; ELECTRON IONIZATION MASS SPECTRA; EXPERIMENTAL CONDITIONS; MASS SPECTROMETRY ANALYSIS; ORGANICS; PRIMARY IONS; SIMPLE++; SPECTRA'S; STATIC SECONDARY ION MASS SPECTROMETRIES; STRUCTURAL INFORMATION;

SECONDARY ION MASS SPECTROMETRY;

EID: 50249155802     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.3648     Document Type: Article

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