Electronic transport in multiwalled carbon nanotubes contacted with patterned electrodes

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 43, Issue 8 B, 2004, Pages

  Hobara, Rei ^a   Yoshimoto, Shinya ^a   Ikuno, Takashi ^b   Katayama, Mitsuhiro ^b   Yamauchi, Norihiro ^b   Wongwiriyapan, Winadda ^b   Honda, Shin Ichi ^b   Matsuda, Iwao ^a   Hasegawa, Shuji ^a   Oura, Kenjiro ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Carbon nanotube; Conductance; Electrode; I V characteristic; Multiprobe STM

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRODES; IMPURITIES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONIC TRANSPORT; I-V CHARACTERISTICS; MULTIPROBE STM; MULTIWALLED CARBON NANOTUBES (MWCNT);

CARBON NANOTUBES;

EID: 6344294121     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.L1081     Document Type: Article

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