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Volumn 19, Issue 10, 2004, Pages 2859-2870

Metalorganic chemical vapor deposition of highly oriented thin film composites of V2O5 and V6O 13: Suppression of the metal-semiconductor transition in V6O13

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPOSITE MATERIALS; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; FREE ENERGY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHASE TRANSITIONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR GROWTH; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 6344280637     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0394     Document Type: Article
Times cited : (27)

References (35)
  • 1
    • 0021120508 scopus 로고
    • Electron concentration in vanadium(V) oxide single crystals as determined by 1/f noise measurements
    • I. Hevesi, L.B. Kiss, M.I. Torok, and L. Nanai: Electron concentration in vanadium(V) oxide single crystals as determined by 1/f noise measurements. Phys. Status Solidi, Appl. Res. A 81, K67 (1984).
    • (1984) Phys. Status Solidi, Appl. Res. A , vol.81
    • Hevesi, I.1    Kiss, L.B.2    Torok, M.I.3    Nanai, L.4
  • 3
    • 0342659710 scopus 로고
    • Electrical conductivity of vanadium oxides
    • S. Kachi, T. Takada, and K. Kosuge: Electrical conductivity of vanadium oxides. J. Phys. Soc. Jpn. 18, 1839 (1963).
    • (1963) J. Phys. Soc. Jpn. , vol.18 , pp. 1839
    • Kachi, S.1    Takada, T.2    Kosuge, K.3
  • 6
    • 0001952352 scopus 로고    scopus 로고
    • Vanadium pentoxide I. Structures and properties
    • J. Haber, M. Witko, and R. Tokarz: Vanadium pentoxide I. Structures and properties. Appl. Catal. A: General 157, 3 (1997).
    • (1997) Appl. Catal. A: General , vol.157 , pp. 3
    • Haber, J.1    Witko, M.2    Tokarz, R.3
  • 7
    • 0042448342 scopus 로고
    • A refinement of the structure of vanadium pentoxide
    • R. Enjalbert and J. Galy: A refinement of the structure of vanadium pentoxide. Acta Crystallogr. C 42, 1467 (1986).
    • (1986) Acta Crystallogr. C. , vol.42 , pp. 1467
    • Enjalbert, R.1    Galy, J.2
  • 10
    • 0037725324 scopus 로고    scopus 로고
    • 5/AC catalyst during selective catalytic reduction of nitric oxide by ammonia at low temperatures
    • 5/AC catalyst during selective catalytic reduction of nitric oxide by ammonia at low temperatures. J. Catal. 214, 213 (2003).
    • (2003) J. Catal. , vol.214 , pp. 213
    • Huang, Z.1    Zhu, Z.2    Liu, Z.3    Liu, Q.4
  • 11
  • 15
    • 0034500826 scopus 로고    scopus 로고
    • 5 electrochemic thin films on transparent conductive glass by pulsed excimer laser ablation technique
    • 5 electrochemic thin films on transparent conductive glass by pulsed excimer laser ablation technique. J. Phys. D: Appl. Phys. 33, 3018 (2000).
    • (2000) J. Phys. D: Appl. Phys. , vol.33 , pp. 3018
    • Fang, G.J.1    Liu, Z.L.2    Wang, Y.Q.3    Liu, H.H.4    Yao, K.L.5
  • 18
    • 0036794677 scopus 로고    scopus 로고
    • Intelligent window coatings: Atmospheric pressure chemical vapour deposition of vanadium oxides
    • T.D. Manning, I.P. Parkin, R.J.H. Clark, D. Sheel, M.E. Pemble, and D. Vernadou: Intelligent window coatings: atmospheric pressure chemical vapour deposition of vanadium oxides. J. Mater. Chem. 12, 2936 (2002).
    • (2002) J. Mater. Chem. , vol.12 , pp. 2936
    • Manning, T.D.1    Parkin, I.P.2    Clark, R.J.H.3    Sheel, D.4    Pemble, M.E.5    Vernadou, D.6
  • 24
    • 0035371451 scopus 로고    scopus 로고
    • XRD and Raman study of vanadium oxide thin films deposited on fused silica substrates by RF magnetron sputtering
    • X.J. Wang, H.D. Li, Y.J. Fei, X. Wang, Y.Y. Xiong, Y.X. Nie, and K.A. Feng: XRD and Raman study of vanadium oxide thin films deposited on fused silica substrates by RF magnetron sputtering. Appl. Surf. Sci. 177, 8 (2001).
    • (2001) Appl. Surf. Sci. , vol.177 , pp. 8
    • Wang, X.J.1    Li, H.D.2    Fei, Y.J.3    Wang, X.4    Xiong, Y.Y.5    Nie, Y.X.6    Feng, K.A.7
  • 29
    • 0001659581 scopus 로고
    • Optical absorption coefficients of vanadium pentoxide single crystals
    • N. Kenay, O.R. Kannewurf, and D.H. Whitmore: Optical absorption coefficients of vanadium pentoxide single crystals. J. Phys. Chem. Solids 27, 1237 (1966).
    • (1966) J. Phys. Chem. Solids , vol.27 , pp. 1237
    • Kenay, N.1    Kannewurf, O.R.2    Whitmore, D.H.3
  • 30
    • 0001659409 scopus 로고    scopus 로고
    • Growth characteristics and surface roughening of vapor-deposited MgO thin films
    • J-G. Yoon, H.K. Oh, and S.J. Lee: Growth characteristics and surface roughening of vapor-deposited MgO thin films. Phys. Rev. B 60, 2839 (1999).
    • (1999) Phys. Rev. B , vol.60 , pp. 2839
    • Yoon, J.-G.1    Oh, H.K.2    Lee, S.J.3
  • 31
    • 0021393552 scopus 로고
    • Surface-energy-driven secondary grain growth in ultrathin (<100 nm) films of silicon
    • C.V. Thompson and H.I. Smith: Surface-energy-driven secondary grain growth in ultrathin (<100 nm) films of silicon. Appl. Phys. Lett. 44, 603 (1984).
    • (1984) Appl. Phys. Lett. , vol.44 , pp. 603
    • Thompson, C.V.1    Smith, H.I.2
  • 32
    • 0001183185 scopus 로고
    • Oriented crystal growth on amorphous substrates using artificial surface-relief gratings
    • H.I. Smith and D.C. Flanders: Oriented crystal growth on amorphous substrates using artificial surface-relief gratings. Appl. Phys. Lett. 32, 349 (1978).
    • (1978) Appl. Phys. Lett. , vol.32 , pp. 349
    • Smith, H.I.1    Flanders, D.C.2
  • 33
    • 0037809420 scopus 로고    scopus 로고
    • MOCVD of cobalt oxide thin films: Dependence of growth, microstructure, and optical properties on the source of oxidation
    • A.U. Mane and S.A. Shivashankar: MOCVD of cobalt oxide thin films: Dependence of growth, microstructure, and optical properties on the source of oxidation. J. Cryst. Growth 254, 368 (2003).
    • (2003) J. Cryst. Growth , vol.254 , pp. 368
    • Mane, A.U.1    Shivashankar, S.A.2
  • 35
    • 0342934062 scopus 로고
    • Temperature-oxygen fugacity tables for gas mixtures in system C-H-O at one atmosphere total pressure
    • No. 88 (The Pennsylvania State University, University Park, PA)
    • P. Deines, R.H. Nafziger, G.C. Ulmer, and E. Woerman: Temperature-oxygen fugacity tables for gas mixtures in system C-H-O at one atmosphere total pressure. Bulletin of Earth and Minerals Experimental Section, No. 88 (The Pennsylvania State University, University Park, PA, 1974).
    • (1974) Bulletin of Earth and Minerals Experimental Section
    • Deines, P.1    Nafziger, R.H.2    Ulmer, G.C.3    Woerman, E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.