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Volumn 12, Issue 2, 2002, Pages 333-338
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Microstructure and properties of VO2 thin films deposited by MOCVD from vanadyl acetylacetonate
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
METAL OXIDE;
VANADIUM DERIVATIVE;
ARTICLE;
FILM;
SEMICONDUCTOR;
STRUCTURE ANALYSIS;
TEMPERATURE;
THERMAL ANALYSIS;
THERMOGRAVIMETRY;
X RAY DIFFRACTION;
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EID: 0036163874
PISSN: 09599428
EISSN: None
Source Type: Journal
DOI: 10.1039/b106563g Document Type: Article |
Times cited : (123)
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References (23)
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