메뉴 건너뛰기




Volumn 2, Issue , 2003, Pages 282-285

Compact bipolar transistor modeling - Issues and possible solutions

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG COMPUTERS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; EPITAXIAL GROWTH; INTEGRATED CIRCUIT LAYOUT; LITHOGRAPHY; MATHEMATICAL MODELS; OPTIMIZATION; PARAMETER ESTIMATION; SIMULATORS;

EID: 6344221640     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (18)
  • 1
    • 0030270762 scopus 로고    scopus 로고
    • VBIC95, the vertical bipolar intercompany model
    • C. McAndrew et al., "VBIC95, the vertical bipolar intercompany model", IEEE J. Solid-State Circuits, Vol. 31, pp. 1476-1483, 1996.
    • (1996) IEEE J. Solid-State Circuits , vol.31 , pp. 1476-1483
    • McAndrew, C.1
  • 4
    • 0036714379 scopus 로고    scopus 로고
    • A novel transistor model for simulating avalanche-breakdown effects in Si bipolar circuits
    • M. Rickelt and H.-M. Rein, "A novel transistor model for simulating avalanche-breakdown effects in Si bipolar circuits", IEEE J. Solid-State Circuits, Vol. 37, 2002, pp. 1184-1197.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , pp. 1184-1197
    • Rickelt, M.1    Rein, H.-M.2
  • 5
    • 0036714849 scopus 로고    scopus 로고
    • Equivalent circuit modeling of static substrate thermal coupling using VCVS representation
    • Walkey et al., "Equivalent circuit modeling of static substrate thermal coupling using VCVS representation", IEEE J. Solid-State Circuits, Vol. 37, 2002, pp. 1198-206.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , pp. 1198-1206
    • Walkey1
  • 6
    • 6344267879 scopus 로고    scopus 로고
    • Modeling of high-frequency noise in BJTs
    • Rockwell Inc
    • Z. Van and M. Schroter, "Modeling of high-frequency noise in BJTs", Rockwell Inc., Internal Report, 1998.
    • (1998) Internal Report
    • Van, Z.1    Schroter, M.2
  • 7
    • 0033169551 scopus 로고    scopus 로고
    • Physics- And process-based bipolar transistor modeling for integrated circuit design
    • M. Schroter et al., "Physics- and process-based bipolar transistor modeling for integrated circuit design", IEEE J. of Solid-State Circuits, Vol. 34, pp. 1136-1149, 1999.
    • (1999) IEEE J. of Solid-State Circuits , vol.34 , pp. 1136-1149
    • Schroter, M.1
  • 9
    • 0030213937 scopus 로고    scopus 로고
    • Design considerations for very-high-speed Si-bipolar ICs operating up to 50Gb/s
    • H.-M. Rein and M. Möller, "Design considerations for very-high-speed Si-bipolar ICs operating up to 50Gb/s", IEEE J. Solid-State Circuits, Vol. 31, pp. 1076-1090, 1996.
    • (1996) IEEE J. Solid-State Circuits , vol.31 , pp. 1076-1090
    • Rein, H.-M.1    Möller, M.2
  • 10
    • 0030270723 scopus 로고    scopus 로고
    • Modelling substrate effects in the design of high-speed si-bipolar ICs
    • M. Pfost, H.-M. Rein and T. Holzwarth, "Modelling substrate effects in the design of high-speed Si-bipolar ICs", IEEE J. Solid-State Circuits, Vol. 31, 1996, pp. 1493-1497.
    • (1996) IEEE J. Solid-State Circuits , vol.31 , pp. 1493-1497
    • Pfost, M.1    Rein, H.-M.2    Holzwarth, T.3
  • 11
    • 0031333539 scopus 로고    scopus 로고
    • A scalable, statistical SPICE gummel-poon model for SiGE HBTs
    • Minneapolis
    • K. Walteret al., "A scalable, statistical SPICE Gummel-Poon model for SiGE HBTs", IEEE Bipolar and BiCMOS Circuits and Technology Meeting, Minneapolis, pp. 32-35, 1997.
    • (1997) IEEE Bipolar and BiCMOS Circuits and Technology Meeting , pp. 32-35
    • Walter, K.1
  • 12
    • 6344232709 scopus 로고    scopus 로고
    • BMFT-HGDAT, Milestone Report, 12/2002.
    • Milestone Report , vol.12 , Issue.2002
  • 13
    • 6344263057 scopus 로고    scopus 로고
    • BMFT-HGDAT, Milestone Report, 12/2001.
    • Milestone Report , vol.12 , Issue.2001
  • 14
    • 6344276231 scopus 로고    scopus 로고
    • www.tiburon-da.com


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.