Transmission electron microscopy study of the deformation behavior of Cu/Nb and Cu/Ni nanoscale multilayers during nanoindentation

Journal of Materials Research

Volumn 24, Issue 3, 2009, Pages 1291-1302

  Bhattacharyya, D ^a   Mara, N A ^a   Dickerson, P ^a   Hoagland, R G ^a   Misra, A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION BEHAVIORS; DEFORMATION MECHANISMS; FOCUSED-ION-BEAM TECHNIQUES; LAYER THICKNESS; METALLIC MULTILAYERS; MICRO-STRUCTURAL CHANGES; NANO-SCALE; NANOSCALE MULTILAYERS; ORIENTATION CHANGES; SHEAR BAND FORMATIONS; TRANSMISSION ELECTRON MICROSCOPES;

BENDING (DEFORMATION); ELECTRON MICROSCOPES; EXTRACTION; FOCUSED ION BEAMS; NANOSTRUCTURED MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

MULTILAYERS;

EID: 63149158058     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0147     Document Type: Article

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