Importance of surface preparation on the nano-indentation stress-strain curves measured in metals

Journal of Materials Research

Volumn 24, Issue 3, 2009, Pages 1142-1155

  Pathak, Siddhartha ^a   Stojakovic, Dejan ^a   Doherty, Roger ^a   Kalidindi, Surya R ^a  

^a Drexel University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ANALYSIS METHODS; DATA ANALYSIS TECHNIQUES; ELASTIC-PLASTIC TRANSITIONS; ELECTRO-POLISHING; INDENTER; MECHANICAL POLISHING; METAL SAMPLES; METAL SURFACES; NANO INDENTATIONS; SURFACE OXIDE LAYERS; SURFACE PREPARATIONS; THIN OXIDE LAYERS; YIELD STRENGTHS;

ELECTROLYTIC POLISHING; METAL RECOVERY; NANOINDENTATION; SEMICONDUCTOR SWITCHES; SMELTING; STRESS-STRAIN CURVES; YIELD STRESS;

VICKERS HARDNESS TESTING;

EID: 63149110884     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0137     Document Type: Article

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