Determining the stress-strain behavior at micro- and nanometer scales by coupling nanoindentation to numerical simulation

EMPA Activities

Volumn , Issue SPEC.RAPORT, 2002, Pages 6-7

  Michler, Johann ^a   Stauss, Sven ^a   Schwaller, Patrick ^a   Bucaille, Jean Luc ^a   Felder, Eric ^a  

^a EPFL   (Switzerland)

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[No Author keywords available]

Indexed keywords

EID: 0038406351     PISSN: 16601394     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)