Flash memory under cosmic and alpha irradiation

IEEE Transactions on Device and Materials Reliability

Volumn 4, Issue 3, 2004, Pages 371-376

  Fogle, Adam David ^a   Darling, Don ^a   Blish II, Richard C ^a   Daszko, Eugene ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

Alpha particle radiation effects; CMOS memory integrated circuits; Cosmic rays; Neutron radiation effects; Proton radiation effects

Indexed keywords

ALPHA PARTICLES; CMOS INTEGRATED CIRCUITS; COSMIC RAYS; DOSIMETRY; ERROR ANALYSIS; NEUTRON IRRADIATION; POLYSILICON; PROTON IRRADIATION; RADIATION EFFECTS; STATIC RANDOM ACCESS STORAGE;

ALPHA PARTICLE RADIATION EFFECTS; CMOS MEMORY INTEGRATED CIRCUITS; NEUTRON RADIATION EFFECTS; PROTON RADIATION EFFECTS;

FLASH MEMORY;

EID: 11144234850     PISSN: 15304388     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDMR.2004.834054     Document Type: Article

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