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Volumn , Issue , 2008, Pages 588-594

A study of SnAgNiCo vs Sn3.8AgO.7Cu C5 lead free solder alloy on mechanical strength of BGA solder joint

Author keywords

BGA packaging; Brittle solder joint; Intermetallic; Lead free C5; Pull strength; Shear; Sn3.8AgO.7Cu; SnAgNiCo

Indexed keywords

BGA PACKAGING; BRITTLE SOLDER JOINT; LEAD-FREE C5; PULL STRENGTH; SHEAR; SN3.8AGO.7CU; SNAGNICO;

EID: 63049137281     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2008.4763497     Document Type: Conference Paper
Times cited : (13)

References (15)
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  • 2
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    • (Url-http://focus.ti.com/quality/docs), 09/02/2008b.
  • 4
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    • The effects of additives to SnAgCu alloys on micro structure and drop impact reliability of solder joints
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    • Liu, W.1    Lee, N.C.2
  • 5
    • 33845586688 scopus 로고    scopus 로고
    • A study of nano particles in SnAg-based lead free solders for intermetallic compounds and drop test performance
    • Masazumi Amagai. A study of nano particles in SnAg-based lead free solders for intermetallic compounds and drop test performance. Proceedings of Electronic Components and Technology Conference. (2006). 1170-1190.
    • (2006) Proceedings of Electronic Components and Technology Conference , pp. 1170-1190
    • Amagai, M.1
  • 8
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    • 4 nanopaticles on morphology of Sn-Ag-Ni solders by mechanical alloying
    • 4 nanopaticles on morphology of Sn-Ag-Ni solders by mechanical alloying. Journal of Electonic Materials. 35(3). 494-503.
    • (2005) Journal of Electonic Materials , vol.35 , Issue.3 , pp. 494-503
    • Lee, H.Y.1    Duh, J.G.2
  • 9
    • 41549139282 scopus 로고    scopus 로고
    • Characterization of Co-Sn intermetallic compounds in Sn-3.0Ag-0.5Cu-0.5Co lead-free solder alloy
    • Gao, F., Cheng, F., Hiroshi Nishikawa, Tadashi Takemoto. (2008). Characterization of Co-Sn intermetallic compounds in Sn-3.0Ag-0.5Cu-0.5Co lead-free solder alloy. Materials Letters. 62. 2257-2259.
    • (2008) Materials Letters , vol.62 , pp. 2257-2259
    • Gao, F.1    Cheng, F.2    Nishikawa, H.3    Takemoto, T.4
  • 10
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    • Effect of Soldering and Aging Time on Interfacial Micro structure and Growth on Intermetallic Compounds between Sn-3.5Ag Solder Alloy and Cu substrate
    • Choi, W.K., & Lee, H.M. (2000). Effect of Soldering and Aging Time on Interfacial Micro structure and Growth on Intermetallic Compounds between Sn-3.5Ag Solder Alloy and Cu substrate. Journal of Electronic Materials. 29(10). 1207-1213.
    • (2000) Journal of Electronic Materials , vol.29 , Issue.10 , pp. 1207-1213
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  • 11
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    • Interfacial reactions between lead-free solders and common base materials
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    • Laurila, T.1    Vuorinen, V.2    Kivilahti, J.K.3
  • 12
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    • Interfacial reaction issues for lead-free electronic solders
    • Ho, C.E., Yang, S.C., Kao, C.R. (2007). Interfacial reaction issues for lead-free electronic solders. Journal of Materials Science. 18. 155-174.
    • (2007) Journal of Materials Science , vol.18 , pp. 155-174
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  • 13
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    • Nano-indentation characterization of Ni-Cu-Sn IMC layer subject to isothermal aging
    • Xu, L., Pang, J.H.L. (2006). Nano-indentation characterization of Ni-Cu-Sn IMC layer subject to isothermal aging. Thin Solid Films. 504. 362-366.
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  • 14
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    • Investigation of IMC Thickness Effect on the Lead-free Solder Ball Attachment Strength: Comparison between Ball Shear Test and Cold Bump Pull Test Results. Microsystems, Packaging
    • Taiwan
    • Song, F., & Lee, S.W.R. (2006). Investigation of IMC Thickness Effect on the Lead-free Solder Ball Attachment Strength: Comparison between Ball Shear Test and Cold Bump Pull Test Results. Microsystems, Packaging, Assembly Conference Taiwan.
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    • Song, F.1    Lee, S.W.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.