Is there always performance overhead for regular fabric?

26th IEEE International Conference on Computer Design 2008, ICCD

Volumn , Issue , 2008, Pages 557-562

  Lin, Yi Wei ^a   Marek Sadowska, Malgorzata ^a   Maly, Wojciech ^b   Pfitzner, Andrzej ^c   Kasprowicz, Dominik ^c  

^a UC Santa Barbar   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP AREAS; CMOS CIRCUITS; HIGH DENSITIES; MANUFACTURABILITY; MANUFACTURING PROCESS; POWER DENSITIES; TRANSISTOR ARRAYS;

FABRICS; TIMING CIRCUITS;

ELECTRIC NETWORK ANALYSIS;

EID: 62349142652     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2008.4751916     Document Type: Conference Paper

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