Routing architecture exploration for regular fabrics

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 204-207

  Kheterpal, V ^a   Strojwas, A J ^a   Pileggi, L ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

BEOL; Regularity

Indexed keywords

ALGORITHMS; CAPACITANCE; CHEMICAL MECHANICAL POLISHING; ELECTRIC RESISTANCE; LITHOGRAPHY; STANDARDS; TRANSISTORS;

BEOL; CONFIGURABLE FABRIC; PARASITIC COMPONENT; PROGRAMMABLE LOGIC BLOCKS (PLB);

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 4444239811     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996625     Document Type: Conference Paper

References (7)

1. L. Pileggi, H. Schmit, A. J. Strojwas et al, "Exploring regular fabrics to optimize the performance-cost trade-off" Proceedings of the ACM/IEEE DAC-2003.
2. M. Palusinski, A. J. Strojwas and W. Maly, "Regularity in Physical Design", GSRC Workshop, Las Vages, June 2001
3. A. J. Strojwas, "Process-Design Interaction Modeling Based Design For Manufacturability", Tutorial, DAC-2003.
4. http://www.easic.com, http://www.lightspeed.com
5. D.T. Blaauw et al, "Statistical Timing Analysis using Bounds and Selective Enumeration", IEEE Trans. on CAD of Integrated Circuits and Systems, Vol. 22, No.9, Sep 2003
6. B. Tyrrell et al, "Investigation of the physical and practical limits of dense-only phase shift lithography for circuit feature definition", Society of Photo-Optical Instrumentation Engineers, October-2002.
7. Gonzales, Anthony J. et al, "Recent results in the application of e-beam direct-write lithography", Proc. SPIE Vol. 1089, p. 37