-
1
-
-
2342486652
-
The path to ubiquitous and low-cost organic electronic appliances on plastic
-
S.R. Forrest: The path to ubiquitous and low-cost organic electronic appliances on plastic. Nature 428, 911 (2004).
-
(2004)
Nature
, vol.428
, pp. 911
-
-
Forrest, S.R.1
-
2
-
-
9644303535
-
Electronic skin: Architecture and components
-
S. Wagner, S.P. Lacour, J. Jones, P.I. Hsu, J.C. Sturm, T. Li, and Z. Suo: Electronic skin: Architecture and components. Physica E 25, 326 (2005).
-
(2005)
Physica E
, vol.25
, pp. 326
-
-
Wagner, S.1
Lacour, S.P.2
Jones, J.3
Hsu, P.I.4
Sturm, J.C.5
Li, T.6
Suo, Z.7
-
3
-
-
2442530845
-
A woven inverter circuit for e-textile applications
-
E. Bonderover and S. Wagner: A woven inverter circuit for e-textile applications. IEEE Electron Device Lett. 25, 295 (2004).
-
(2004)
IEEE Electron Device Lett
, vol.25
, pp. 295
-
-
Bonderover, E.1
Wagner, S.2
-
4
-
-
2642521445
-
Organic photovoltaics: Technology and market
-
C.J. Brabec: Organic photovoltaics: Technology and market. Sol. Energy Mater. Sol. Cells 83, 273 (2004).
-
(2004)
Sol. Energy Mater. Sol. Cells
, vol.83
, pp. 273
-
-
Brabec, C.J.1
-
5
-
-
0002205822
-
Tensile and fracture behavior of free-standing copper films
-
R.R. Keller, J.M. Phelps, and D.T. Read: Tensile and fracture behavior of free-standing copper films. Mater. Sci. Eng., A 214, 42 (1996).
-
(1996)
Mater. Sci. Eng., A
, vol.214
, pp. 42
-
-
Keller, R.R.1
Phelps, J.M.2
Read, D.T.3
-
6
-
-
0034226704
-
Tensile tesfing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers
-
H. Huang and F. Spaepen: Tensile tesfing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers. Acta Mater. 48, 3261 (2000).
-
(2000)
Acta Mater
, vol.48
, pp. 3261
-
-
Huang, H.1
Spaepen, F.2
-
7
-
-
61749090384
-
-
Y. Xiang, X. Chen, and J.J. Vlassak: The mechanical properties of electroplated Cu thin films measured by means of the bulge test technique, in Thin Films: Stresses and Mechanical Properties IX, edited by C.S. Ozkan, L.B. Freund, R.C. Cammarata, and H. Gao, (Mater. Res. Soc. Symp. Proc. 695, Warrendale, PA, 2002), L4.9.
-
Y. Xiang, X. Chen, and J.J. Vlassak: The mechanical properties of electroplated Cu thin films measured by means of the bulge test technique, in Thin Films: Stresses and Mechanical Properties IX, edited by C.S. Ozkan, L.B. Freund, R.C. Cammarata, and H. Gao, (Mater. Res. Soc. Symp. Proc. 695, Warrendale, PA, 2002), L4.9.
-
-
-
-
8
-
-
0037210072
-
A methodology for determining mechanical properties of freestanding thin films and mems materials
-
H.D. Espinosa, B.C. Prorok, and M. Fischer: A methodology for determining mechanical properties of freestanding thin films and mems materials. J. Mech. Phys. Solids 51, 47 (2003).
-
(2003)
J. Mech. Phys. Solids
, vol.51
, pp. 47
-
-
Espinosa, H.D.1
Prorok, B.C.2
Fischer, M.3
-
9
-
-
0037323307
-
Tensile failure by grain thinning in micromachined aluminum thin films
-
H.J. Lee, P. Zhang, and J.C. Bravman: Tensile failure by grain thinning in micromachined aluminum thin films. J. Appl. Phys. 93, 1443 (2003).
-
(2003)
J. Appl. Phys
, vol.93
, pp. 1443
-
-
Lee, H.J.1
Zhang, P.2
Bravman, J.C.3
-
10
-
-
7544230505
-
Delocalizing strain in a thin metal film on a polymer substrate
-
T. Li, Z.Y. Huang, Z.C. Xi, S.P. Lacour, S. Wagner, and Z. Suo: Delocalizing strain in a thin metal film on a polymer substrate. Mech. Mater. 37, 261 (2005).
-
(2005)
Mech. Mater
, vol.37
, pp. 261
-
-
Li, T.1
Huang, Z.Y.2
Xi, Z.C.3
Lacour, S.P.4
Wagner, S.5
Suo, Z.6
-
11
-
-
33846542473
-
Ductility of thin metal films on polymer substrates modulated by interfacial adhesion
-
T. Li and Z. Suo: Ductility of thin metal films on polymer substrates modulated by interfacial adhesion. Int. J. Solids Struct. 44, 1696 (2006).
-
(2006)
Int. J. Solids Struct
, vol.44
, pp. 1696
-
-
Li, T.1
Suo, Z.2
-
12
-
-
36448999689
-
Fracture of metal-polymer line structures. 1. Semiflexible polyimide
-
S.L. Chui, J. Leu, and P.S. Ho: Fracture of metal-polymer line structures. 1. Semiflexible polyimide. J. Appl. Phys. 76, 5136 (1994).
-
(1994)
J. Appl. Phys
, vol.76
, pp. 5136
-
-
Chui, S.L.1
Leu, J.2
Ho, P.S.3
-
13
-
-
0034285134
-
X-ray diffraction as a toot to study the mechanical behaviour of thin films
-
O. Kraft, M. Hommel, and E. Arzt: X-ray diffraction as a toot to study the mechanical behaviour of thin films. Mater. Sci. Eng., A 288, 209 (2000).
-
(2000)
Mater. Sci. Eng., A
, vol.288
, pp. 209
-
-
Kraft, O.1
Hommel, M.2
Arzt, E.3
-
14
-
-
0035860885
-
Deformation behavior of thin copper films on deformable substrates
-
M. Hommel and O. Kraft: Deformation behavior of thin copper films on deformable substrates. Acta Mater. 49, 3935 (2001).
-
(2001)
Acta Mater
, vol.49
, pp. 3935
-
-
Hommel, M.1
Kraft, O.2
-
15
-
-
0037075747
-
On the interface debond at the edge of a thin film on a thick substrate
-
B.E. Alaca, M.T.A. Saif, and H. Sehitoglu: On the interface debond at the edge of a thin film on a thick substrate. Acta Mater. 50, 1197 (2002).
-
(2002)
Acta Mater
, vol.50
, pp. 1197
-
-
Alaca, B.E.1
Saif, M.T.A.2
Sehitoglu, H.3
-
16
-
-
0037651101
-
Stretchable gold conductors on elastomeric substrates
-
S.P. Lacour, S. Wagner, Z. Huang, and Z. Suo: Stretchable gold conductors on elastomeric substrates. Appl. Phys. Lett. 82, 2404 (2003).
-
(2003)
Appl. Phys. Lett
, vol.82
, pp. 2404
-
-
Lacour, S.P.1
Wagner, S.2
Huang, Z.3
Suo, Z.4
-
17
-
-
1842584184
-
The yield strength of thin copper films on kapton
-
D.Y.W. Yu and F. Spaepen: The yield strength of thin copper films on kapton. J. Appl. Phys. 95, 2991 (2003).
-
(2003)
J. Appl. Phys
, vol.95
, pp. 2991
-
-
Yu, D.Y.W.1
Spaepen, F.2
-
18
-
-
28344439100
-
High ductility of thin metal film adherent on polymer substrate
-
Y. Xiang, T. Li, Z. Suo, and J.J. Vlassak: High ductility of thin metal film adherent on polymer substrate. Appl. Phys. Lett. 87, 161910 (2005).
-
(2005)
Appl. Phys. Lett
, vol.87
, pp. 161910
-
-
Xiang, Y.1
Li, T.2
Suo, Z.3
Vlassak, J.J.4
-
19
-
-
34247344959
-
Thickness dependent critical strain in submicron cu films adherent to polymer substrate
-
R.M. Niu, G. Liu, C. Wang, G. Zhang, X.D. Ding, and J. Sun: Thickness dependent critical strain in submicron cu films adherent to polymer substrate. Appl. Phys. Lett. 90, 161907 (2007).
-
(2007)
Appl. Phys. Lett
, vol.90
, pp. 161907
-
-
Niu, R.M.1
Liu, G.2
Wang, C.3
Zhang, G.4
Ding, X.D.5
Sun, J.6
-
21
-
-
0001622744
-
Tensile testing of AlCu thin films on polyimide foils
-
F. Macionczyk and W. Bruckner: Tensile testing of AlCu thin films on polyimide foils. J. Appl. Phys. 86, 4922 (1999).
-
(1999)
J. Appl. Phys
, vol.86
, pp. 4922
-
-
Macionczyk, F.1
Bruckner, W.2
-
22
-
-
14944345840
-
-
P. Gruber, J. Böhm, A. Wanner, L. Sauter, R. Spolenak, and E. Arzt: Size effect on crack formation in Cu/Ta and Ta/Cu/Ta thin film systems, in Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties, edited by P.M. Anderson, T. Foecke, A. Misra, and R.E. Rudd (Mater. Res. Soc. Symp. Proc. 821, Warrendale, PA, 2004), P2.7.
-
P. Gruber, J. Böhm, A. Wanner, L. Sauter, R. Spolenak, and E. Arzt: Size effect on crack formation in Cu/Ta and Ta/Cu/Ta thin film systems, in Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties, edited by P.M. Anderson, T. Foecke, A. Misra, and R.E. Rudd (Mater. Res. Soc. Symp. Proc. 821, Warrendale, PA, 2004), P2.7.
-
-
-
-
23
-
-
36549066098
-
Metal films on polymer substrates strained beyond 50%
-
N. Lu, X. Wang, Z. Suo, and J.J. Vlassak: Metal films on polymer substrates strained beyond 50%. Appl. Phys. Lett. 91, 221909 (2007).
-
(2007)
Appl. Phys. Lett
, vol.91
, pp. 221909
-
-
Lu, N.1
Wang, X.2
Suo, Z.3
Vlassak, J.J.4
-
24
-
-
32144450456
-
Mechanical properties of nanocrystalline materials
-
M.A. Meyers, A. Mishra, and D.J. Benson: Mechanical properties of nanocrystalline materials. Prog. Mater. Sci. 51, 427 (2006).
-
(2006)
Prog. Mater. Sci
, vol.51
, pp. 427
-
-
Meyers, M.A.1
Mishra, A.2
Benson, D.J.3
-
25
-
-
23944457361
-
Rapid stress-driven grain coarsening in nanocrystalline cu, at ambient and cryogenic temperatures
-
K. Zhang, J.R. Weertman, and J.A. Eastman: Rapid stress-driven grain coarsening in nanocrystalline cu, at ambient and cryogenic temperatures. Appl. Phys. Lett. 87, 061921 (2005).
-
(2005)
Appl. Phys. Lett
, vol.87
, pp. 061921
-
-
Zhang, K.1
Weertman, J.R.2
Eastman, J.A.3
-
26
-
-
4544344914
-
Direct observation of deformation-induced grain growth during the nanoindentation of ultrafine-grained Al at room temperature
-
M. Jin, A.M. Minor, E.A. Stach, and J.W. Moms: Direct observation of deformation-induced grain growth during the nanoindentation of ultrafine-grained Al at room temperature. Acta Mater. 52, 5381 (2004).
-
(2004)
Acta Mater
, vol.52
, pp. 5381
-
-
Jin, M.1
Minor, A.M.2
Stach, E.A.3
Moms, J.W.4
-
27
-
-
33645961888
-
Stress-assisted discontinuous grain growth and its effect on the deformation behavior of nanocrystalline aluminum thin films
-
D.S. Gianola, S. Van Petegeni, M. Legros, S. Brandstetter, H. Van Swygenhoven, and K.J. Hemker: Stress-assisted discontinuous grain growth and its effect on the deformation behavior of nanocrystalline aluminum thin films. Acta Mater. 54, 2253 (2006).
-
(2006)
Acta Mater
, vol.54
, pp. 2253
-
-
Gianola, D.S.1
Van Petegeni, S.2
Legros, M.3
Brandstetter, S.4
Van Swygenhoven, H.5
Hemker, K.J.6
-
28
-
-
0033677268
-
Structure evolution during processing of polycrystalline films
-
C.V. Thompson: Structure evolution during processing of polycrystalline films. Annu. Rev. Mater. Sci. 30, 159 (2000).
-
(2000)
Annu. Rev. Mater. Sci
, vol.30
, pp. 159
-
-
Thompson, C.V.1
-
29
-
-
84996252992
-
Surface energy anisotropy by an improved thermal grooving technique
-
M. McLean and B. Gale: Surface energy anisotropy by an improved thermal grooving technique. Philos. Mag. 20, 1033 (1969).
-
(1969)
Philos. Mag
, vol.20
, pp. 1033
-
-
McLean, M.1
Gale, B.2
-
30
-
-
0000415055
-
The influence of strain energy on abnormal grain growth in copper thin films
-
E.M. Zielinski, R.P. Vinci, and J.C. Bravman: The influence of strain energy on abnormal grain growth in copper thin films. Appl. Phys. Lett. 67, 1078 (1995).
-
(1995)
Appl. Phys. Lett
, vol.67
, pp. 1078
-
-
Zielinski, E.M.1
Vinci, R.P.2
Bravman, J.C.3
-
31
-
-
0003636139
-
-
CRC Press, Boca Raton, FL
-
G. Gottstein and L.S. Shvindlerman: Grain Boundary Migration in Metals: Thermodynamics, Kinetics, Applications (CRC Press, Boca Raton, FL, 1999).
-
(1999)
Grain Boundary Migration in Metals: Thermodynamics, Kinetics, Applications
-
-
Gottstein, G.1
Shvindlerman, L.S.2
-
32
-
-
4243092655
-
A unified approach to motion of grain boundaries, relative tangential translation along grain boundaries, and grain rotation
-
J.W. Cahn and J.E. Taylor: A unified approach to motion of grain boundaries, relative tangential translation along grain boundaries, and grain rotation. Acta Mater. 52, 4887 (2004).
-
(2004)
Acta Mater
, vol.52
, pp. 4887
-
-
Cahn, J.W.1
Taylor, J.E.2
-
33
-
-
33645984482
-
Atomic mechanisms of grain boundary motion
-
A. Suzuki and Y. Mishin: Atomic mechanisms of grain boundary motion. Mater. Sci. Forum 502, 157 (2005).
-
(2005)
Mater. Sci. Forum
, vol.502
, pp. 157
-
-
Suzuki, A.1
Mishin, Y.2
-
34
-
-
0035980528
-
Migration of grain boundaries under the influence of an external shear stress
-
M. Winning, G. Gottstein, and L.S. Shvindlerman: Migration of grain boundaries under the influence of an external shear stress. Mater. Sci. Eng., A 317, 17 (2001).
-
(2001)
Mater. Sci. Eng., A
, vol.317
, pp. 17
-
-
Winning, M.1
Gottstein, G.2
Shvindlerman, L.S.3
-
36
-
-
33846929466
-
Low angle tilt boundary migration coupled to shear deformation
-
D.A. Molodov, V.A. Ivanov, and G. Gottstein: Low angle tilt boundary migration coupled to shear deformation. Acta Mater. 55, 1843 (2007).
-
(2007)
Acta Mater
, vol.55
, pp. 1843
-
-
Molodov, D.A.1
Ivanov, V.A.2
Gottstein, G.3
|