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Review of Scientific Instruments

Volumn 80, Issue 2, 2009, Pages

Thermal conductivity measurement of fluids using the 3ω method

(1) Lee, Seung Min a

a LG Electronics Inc (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUBES; ETHANOL; ETHYLENE GLYCOL; PROBES; THERMAL CONDUCTIVITY; THERMAL CONDUCTIVITY OF GASES; THERMAL CONDUCTIVITY OF LIQUIDS; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL INSULATING MATERIALS; THERMOANALYSIS; THERMODYNAMIC PROPERTIES; WIRE;

ELECTRONIC CIRCUITS; FREQUENCY RANGES; HOT-WIRE METHODS; LINEAR-LOGARITHMIC; OPTIMAL FREQUENCIES; PROBE GEOMETRIES; STEADY STATE; TEMPERATURE RESPONSE; TETRAETHYLENE GLYCOLS; THERMAL BOUNDARY CONDUCTANCES; THERMAL CONDUCTIVITY MEASUREMENTS; THIN METAL FILMS; THIN METAL WIRES; VOLUMETRIC HEAT CAPACITIES;

DIELECTRIC LIQUIDS;

EID: 61449221031 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3082036 Document Type: Article

Times cited : (37)

References (30)

1
- 36549099049
- 0034-6748 10.1063/1.1141498.
- D. G. Cahill, Rev. Sci. Instrum. 0034-6748 10.1063/1.1141498 61, 802 (1990).
- (1990) Rev. Sci. Instrum. , vol.61 , pp. 802
- Cahill, D.G.¹

2
- 0000088968
- 0163-1829 10.1103/PhysRevB.52.6381.
- Y. H. Jeong and I. K. Moon, Phys. Rev. B 0163-1829 10.1103/PhysRevB.52. 6381 52, 6381 (1995).
- (1995) Phys. Rev. B , vol.52 , pp. 6381
- Jeong, Y.H.¹ Moon, I.K.²

3
- 0001679381
- 0163-1829 10.1103/PhysRevB.52.253.
- S. -M. Lee, D. G. Cahill, and T. H. Allen, Phys. Rev. B 0163-1829 10.1103/PhysRevB.52.253 52, 253 (1995).
- (1995) Phys. Rev. B , vol.52 , pp. 253
- Lee, S.-M.¹ Cahill, D.G.² Allen, T.H.³

4
- 0031094623
- 0021-8979 10.1063/1.363923.
- S. -M. Lee and D. G. Cahill, J. Appl. Phys. 0021-8979 10.1063/1.363923 81, 2590 (1997).
- (1997) J. Appl. Phys. , vol.81 , pp. 2590
- Lee, S.-M.¹ Cahill, D.G.²

5
- 0000941763
- 0021-8979 10.1063/1.371314.
- J. H. Kim, A. Feldman, and D. Novotny, J. Appl. Phys. 0021-8979 10.1063/1.371314 86, 3959 (1999).
- (1999) J. Appl. Phys. , vol.86 , pp. 3959
- Kim, J.H.¹ Feldman, A.² Novotny, D.³

6
- 0033534934
- 0040-6090 10.1016/S0040-6090(98)01328-5.
- Y. S. Ju, K. Kurabayashi, and K. E. Goodson, Thin Solid Films 0040-6090 10.1016/S0040-6090(98)01328-5 339, 160 (1999).
- (1999) Thin Solid Films , vol.339 , pp. 160
- Ju, Y.S.¹ Kurabayashi, K.² Goodson, K.E.³

7
- 35949018243
- 0163-1829 10.1103/PhysRevB.34.1631.
- N. O. Birge, Phys. Rev. B 0163-1829 10.1103/PhysRevB.34.1631 34, 1631 (1986).
- (1986) Phys. Rev. B , vol.34 , pp. 1631
- Birge, N.O.¹

8
- 0035306385
- 0034-6748 10.1063/1.1353189.
- T. Borca-Tasciuc, A. R. Kumar, and G. Chen, Rev. Sci. Instrum. 0034-6748 10.1063/1.1353189 72, 2139 (2001).
- (2001) Rev. Sci. Instrum. , vol.72 , pp. 2139
- Borca-Tasciuc, T.¹ Kumar, A.R.² Chen, G.³

9
- 0036537098
- 0021-8979 10.1063/1.1459611.
- A. Jacquot, B. Lenoir, A. Dauscher, M. Stölzer, and J. Meusel, J. Appl. Phys. 0021-8979 10.1063/1.1459611 91, 4733 (2002).
- (2002) J. Appl. Phys. , vol.91 , pp. 4733
- Jacquot, A.¹ Lenoir, B.² Dauscher, A.³ Stölzer, M.⁴ Meusel, J.⁵

10
- 0037097910
- 0021-8979 10.1063/1.1481958.
- T. Yamane, Y. Mori, S. Katayama, and M. Todoki, J. Appl. Phys. 0021-8979 10.1063/1.1481958 91, 9772 (2002).
- (2002) J. Appl. Phys. , vol.91 , pp. 9772
- Yamane, T.¹ Mori, Y.² Katayama, S.³ Todoki, M.⁴

11
- 10844282597
- 0034-6748 10.1063/1.1805771.
- F. Chen, J. Shulman, Y. Xue, C. W. Chu, and G. S. Nolas, Rev. Sci. Instrum. 0034-6748 10.1063/1.1805771 75, 4578 (2004).
- (2004) Rev. Sci. Instrum. , vol.75 , pp. 4578
- Chen, F.¹ Shulman, J.² Xue, Y.³ Chu, C.W.⁴ Nolas, G.S.⁵

12
- 18744380690
- 0034-6748 10.1063/1.1896619.
- B. W. Olson, S. Graham, and K. Chen, Rev. Sci. Instrum. 0034-6748 10.1063/1.1896619 76, 053901 (2005).
- (2005) Rev. Sci. Instrum. , vol.76 , pp. 053901
- Olson, B.W.¹ Graham, S.² Chen, K.³

13
- 3042633856
- 0003-6951 10.1063/1.1758301.
- A. Majumdar and P. Peddy, Appl. Phys. Lett. 0003-6951 10.1063/1.1758301 84, 4768 (2004).
- (2004) Appl. Phys. Lett. , vol.84 , pp. 4768
- Majumdar, A.¹ Peddy, P.²

14
- 20844455764
- 0003-6951 10.1063/1.1931827.
- Y. S. Ju, M. -T. Hung, M. J. Carey, M. -C. Cyrille, and J. R. Childress, Appl. Phys. Lett. 0003-6951 10.1063/1.1931827 86, 203113 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 203113
- Ju, Y.S.¹ Hung, M.-T.² Carey, M.J.³ Cyrille, M.-C.⁴ Childress, J.R.⁵

15
- 44649122694
- 0034-6748 10.1063/1.2927253.
- H. -C. Chien, D. -J. Yao, M. -J. Huang, and T. -Y. Chang, Rev. Sci. Instrum. 0034-6748 10.1063/1.2927253 79, 054902 (2008).
- (2008) Rev. Sci. Instrum. , vol.79 , pp. 054902
- Chien, H.-C.¹ Yao, D.-J.² Huang, M.-J.³ Chang, T.-Y.⁴

16
- 1142310597
- 0036-8075 10.1126/science.1093711.
- R. M. Costescu, D. G. Cahill, F. H. Fabreguette, Z. A. Sechrist, and S. M. George, Science 0036-8075 10.1126/science.1093711 303, 989 (2004).
- (2004) Science , vol.303 , pp. 989
- Costescu, R.M.¹ Cahill, D.G.² Fabreguette, F.H.³ Sechrist, Z.A.⁴ George, S.M.⁵

17
- 0016919518
- 0034-6748 10.1063/1.1134581.
- P. Andersson and G. Bäckström, Rev. Sci. Instrum. 0034-6748 10.1063/1.1134581 47, 205 (1976).
- (1976) Rev. Sci. Instrum. , vol.47 , pp. 205
- Andersson, P.¹ Bäckström, G.²

18
- 0019526993
- 0034-6748 10.1063/1.1136577.
- Y. Nagasaka and A. Nagashima, Rev. Sci. Instrum. 0034-6748 10.1063/1.1136577 52, 229 (1981).
- (1981) Rev. Sci. Instrum. , vol.52 , pp. 229
- Nagasaka, Y.¹ Nagashima, A.²

19
- 0019621465
- 0021-9568 10.1021/je00026a001.
- J. D. Raal and R. L. Rijdsijk, J. Chem. Eng. Data 0021-9568 10.1021/je00026a001 26, 351 (1981).
- (1981) J. Chem. Eng. Data , vol.26 , pp. 351
- Raal, J.D.¹ Rijdsijk, R.L.²

20
- 61449220123
- Advanced Interconnections Cor.
- Advanced Interconnections Corp., http://www.advanced.com.

21
- 0039997371
- 0047-2689
- K. Stephan and A. Laesecke, J. Phys. Chem. Ref. Data 14, 227 (1985). 0047-2689
- (1985) J. Phys. Chem. Ref. Data , vol.14 , pp. 227
- Stephan, K.¹ Laesecke, A.²

22
- 84897556400
- 0047-2689
- M. L. V. Ramires, C. A. Nieto de Castro, Y. Nagasaka, A. Nagashima, M. J. Assael, and W. A. Wakeham, J. Phys. Chem. Ref. Data 24, 1377 (1995). 0047-2689
- (1995) J. Phys. Chem. Ref. Data , vol.24 , pp. 1377
- Ramires, M.L.V.¹ Nieto De Castro, C.A.² Nagasaka, Y.³ Nagashima, A.⁴ Assael, M.J.⁵ Wakeham, W.A.⁶

23
- 0031237765
- 0021-9568 10.1021/je960351m.
- L. Qun-Fang, L. Rui-Sen, N. Dan-Yan, and H. Yu-Chun, J. Chem. Eng. Data 0021-9568 10.1021/je960351m 42, 971 (1997).
- (1997) J. Chem. Eng. Data , vol.42 , pp. 971
- Qun-Fang, L.¹ Rui-Sen, L.² Dan-Yan, N.³ Yu-Chun, H.⁴

24
- 0019621465
- 0021-9568 10.1021/je00026a001.
- J. D. Raal and R. L. Rijsdijk, J. Chem. Eng. Data 0021-9568 10.1021/je00026a001 26, 351 (1981).
- (1981) J. Chem. Eng. Data , vol.26 , pp. 351
- Raal, J.D.¹ Rijsdijk, R.L.²

25
- 0025419889
- 0021-9568 10.1021/je00060a005.
- R. DiGuilio and A. S. Teja, J. Chem. Eng. Data 0021-9568 10.1021/je00060a005 35, 117 (1990).
- (1990) J. Chem. Eng. Data , vol.35 , pp. 117
- Diguilio, R.¹ Teja, A.S.²

26
- 61449121345
- M. Zábransk, V. Ržička, Jr., V. Majer, and E. S. Domalski, J. Phys. Chem. Ref. Data Monograph No. 6 1, 283 (1996).
- (1996) J. Phys. Chem. Ref. Data Monograph No. 6 , vol.1 , pp. 283
- Zábransk, M.¹ Ržička Jr., V.² Majer, V.³ Domalski, E.S.⁴

27
- 36449007369
- 0034-6748 10.1063/1.1144927.
- S. -M. Lee and S. -I. Kwun, Rev. Sci. Instrum. 0034-6748 10.1063/1.1144927 65, 966 (1994).
- (1994) Rev. Sci. Instrum. , vol.65 , pp. 966
- Lee, S.-M.¹ Kwun, S.-I.²

28
- 34548386201
- 0034-6748 10.1063/1.2777162.
- S. R. Choi, J. Kim, and D. Kim, Rev. Sci. Instrum. 0034-6748 10.1063/1.2777162 78, 084902 (2007).
- (2007) Rev. Sci. Instrum. , vol.78 , pp. 084902
- Choi, S.R.¹ Kim, J.² Kim, D.³

29
- 42649112072
- 1290-0729
- X. J. Hu, A. Jain, and K. E. Goodson, Int. J. Therm. Sci. 47, 820 (2008). 1290-0729
- (2008) Int. J. Therm. Sci. , vol.47 , pp. 820
- Hu, X.J.¹ Jain, A.² Goodson, K.E.³

30
- 0035397356
- 0034-6748 10.1063/1.1378340.
- L. Lu, W. Yi, and D. L. Zhang, Rev. Sci. Instrum. 0034-6748 10.1063/1.1378340 72, 2996 (2001).
- (2001) Rev. Sci. Instrum. , vol.72 , pp. 2996
- Lu, L.¹ Yi, W.² Zhang, D.L.³

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