Characterization of SiO2-overcoated silver-island films as substrates for surface-enhanced Raman scattering

Analytical Chemistry

Volumn 68, Issue 6, 1996, Pages 1003-1011

  Lacy, William B ^a   Williams, John M ^a   Wenzler, Lisa A ^a   Beebe Jr , Thomas P ^a   Harris, Joel M ^a  

^a UNIVERSITY OF UTAH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ADSORPTION ISOTHERMS; AUGER ELECTRON SPECTROSCOPY; CHARACTERIZATION; COATINGS; FILMS; LIGHT ABSORPTION; PHOTOELECTRON SPECTROSCOPY; RAMAN SCATTERING; SILVER; SUBSTRATES;

ADSORPTION KINETICS; PYRIDINE; SILVER ISLAND FILMS; SURFACE ENHANCED RAMAN SCATTERING;

SILICA;

EID: 0030092097     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac950860b     Document Type: Article

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