Lattice strain in bulk GaN epilayers grown on CrN/sapphire template

Applied Physics Letters

Volumn 94, Issue 8, 2009, Pages

  Lee, S W ^a   Ha, Jun Seok ^a   Lee, Hyun Jae ^a   Lee, Hyo Jong ^a   Goto, H ^a   Hanada, T ^a   Goto, T ^a   Fujii, Katsushi ^a   Cho, M W ^a   Yao, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CORUNDUM; EMISSION SPECTROSCOPY; ETCHING; GALLIUM NITRIDE; LASER EXCITATION; SAPPHIRE; SEMICONDUCTING GALLIUM;

BEAM SCANS; BIAXIAL COMPRESSIVE STRAINS; BOUND EXCITONS; C SAPPHIRES; C-PLANE SAPPHIRES; EMISSION ENERGIES; EMISSION INTENSITIES; EMISSION LINES; ENERGY POSITIONS; EXCITATION LASERS; GAN EPILAYERS; GAN FILMS; GAN LAYERS; LATTICE PARAMETERS; LATTICE STRAINS; LINE WIDTHS; LOCAL STRAINS; MICRO-PHOTOLUMINESCENCE SPECTROSCOPIES; SAPPHIRE SUBSTRATES; STRAIN-FREE; SURFACE PROFILERS;

GALLIUM ALLOYS;

EID: 61349095274     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3086890     Document Type: Article

References (16)

1. M. K. Kelly, O. Ambacher, B. Dahlheimer, G. Groos, R. Dimitrov, H. Angerer, and M. Stutzmann, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.117473 69, 1749 (1996).
2. W. S. Wong, Y. Cho, E. R. Weber, T. Sands, K. M. Yu, J. Krüger, A. B. Wengrow, and N. W. Cheung, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.124861 75, 1887 (1999).
3. Y. S. Wu, J. -H. Cheng, W. C. Peng, and H. Ouyang, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2749866 90, 251110 (2007).
4. W. H. Chen, X. N. Kang, X. D. Hu, R. Lee, Y. J. Wang, T. J. Yu, Z. J. Yang, G. Y. Zhang, L. Shan, K. X. Liu, X. D. Shan, L. P. You, and D. P. Yu, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2783134 91, 121114 (2007).
5. H. P. Ho, K. C. Lo, G. G. Siu, C. Surya, K. F. Li, and K. W. Cheah, Mater. Chem. Phys. MCHPDR 0254-0584 10.1016/S0254-0584(03)00146-9 81, 99 (2003).
6. H. Goto, S. W. Lee, H. J. Lee, H. -J. Lee, J. S. Ha, M. W. Cho, and T. Yao, Phys. Status Solidi C 5, 1659 (2008). 0254-0584
7. J. -S. Ha, S. W. Lee, H. -J. Lee, H. -J. Lee, S. H. Lee, H. Goto, T. Kato, K. Fujii, M. W. Cho, and T. Yao, IEEE Photonics Technol. Lett. 20, 175 (2008). 1041-1135
8. T. Kozawa, T. Kachi, H. Kano, H. Nagase, N. Koide, and K. Manabe, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.359465 77, 4389 (1995).
9. V. Darakchieva, T. Paskova, P. P. Paskov, B. Monemar, N. Ashkenov, and M. Schubert, Phys. Status Solidi A PSSABA 0031-8965 10.1002/pssa.200306145 195, 516 (2003).
10. S. W. Lee, T. Minegishi, W. H. Lee, H. Goto, H. J. Lee, S. H. Lee, H. -J. Lee, J. S. Ha, T. Goto, T. Hanada, M. W. Cho, and T. Yao, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2470163 90, 061907 (2007).
11. V. Darakchieva, B. Monemar, and A. Usui, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2753122 91, 031911 (2007).
12. H. Angerer, D. Brunner, F. Freudenberg, O. Ambacher, M. Stutzmann, R. Höpler, T. Metzger, E. Born, G. Dollinger, A. Bergmaier, S. Karsch, and H. J. Korner, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.119949 71, 1504 (1997).
13. T. Azuhata, T. Sota, and K. Suzuki, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/8/18/005 8, 3111 (1996).
14. C. Kisielowski, J. Krüger, S. Ruvimov, T. Suski, J. W. Ager III, E. Jones, Z. Liliental-Weber, M. Rubin, E. R. Weber, M. D. Bremser, and R. F. Davis, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.17745 54, 17745 (1996).
15. W. Shan, R. J. Hauenstein, A. J. Fischer, J. J. Song, W. G. Perry, M. D. Bremser, R. F. Davis, and B. Goldenberg, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.13460 54, 13460 (1996).
16. S. L. Chuang and C. S. Chang, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.2491 54, 2491 (1996).