Structure, dielectric and ferroelectric properties of highly (1 0 0)-oriented BaTiO 3 grown under low-temperature conditions

Applied Surface Science

Volumn 255, Issue 11, 2009, Pages 5922-5925

  Xu, J B ^a,b   Shen, B ^b   Zhai, J W ^b  

^a University of Xinjiang   (China)

^b TONGJI UNIVERSITY   (China)

Author keywords

Crystallographic orientation; Dielectric properties; Ferroelectricity; Thin films

Indexed keywords

BARIUM TITANATE; DIELECTRIC PROPERTIES; DIELECTRIC PROPERTIES OF SOLIDS; FERROELECTRICITY; FIELD EMISSION MICROSCOPES; LANTHANUM COMPOUNDS; NICKEL COMPOUNDS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; THIN FILMS; X RAY DIFFRACTION;

CRYSTALLOGRAPHIC ORIENTATIONS; DIELECTRIC AND FERROELECTRIC PROPERTIES; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FUNCTION OF FREQUENCY; INTEGRATED CIRCUIT MANUFACTURING; LOW TEMPERATURE CONDITIONS; SUBSTRATE TEMPERATURE; X-RAY DIFFRACTION DATA;

SUBSTRATES;

EID: 60949104674     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.01.034     Document Type: Article

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