Quantitative characterization of nanoadhesion by dynamic force spectroscopy

Langmuir

Volumn 25, Issue 1, 2009, Pages 256-261

  Ptak, Arkadiusz ^a   Kappl, Michael ^b   Moreno Flores, Susana ^c   Gojzewski, Hubert ^a,b   Butt, Hans Jürgen ^b  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^c CIC BIOMAGUNE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; SILICON NITRIDE;

ADHESION FORCES; ADHESIVE BONDS; ATOMIC FORCE MICROSCOPES; CONTACT MECHANICS; DYNAMIC FORCE SPECTROSCOPIES; EVANS MODELS; LOADING RATES; NANOADHESION; NANOCONTACTS; QUANTITATIVE CHARACTERIZATIONS; QUANTITATIVE INFORMATIONS; SELF-ASSEMBLED MONOLAYERS;

SELF ASSEMBLY;

ARTICLE; ATOMIC FORCE MICROSCOPY; METHODOLOGY; NANOTECHNOLOGY; SPECTROSCOPY; SURFACE PROPERTY; THEORETICAL MODEL;

MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; NANOTECHNOLOGY; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

EID: 60849133044     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la8028676     Document Type: Article

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