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Volumn 88, Issue 26, 2006, Pages
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Modified atomic force microscope for high-rate dynamic force spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTUATORS;
ADHESION;
INTERFACES (MATERIALS);
NATURAL FREQUENCIES;
PIEZOELECTRIC DEVICES;
RESONANCE;
SPECTROSCOPIC ANALYSIS;
ADHESION FORCES;
DYNAMIC FORCE SPECTROSCOPY;
PIEZOACTUATORS;
RATE-DEPENDENT ADHESION;
ATOMIC FORCE MICROSCOPY;
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EID: 33745605567
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2218273 Document Type: Article |
Times cited : (18)
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References (19)
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