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Volumn 22, Issue 1-3, 2009, Pages 82-86
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Structural and electrical properties of Sb-doped p-type ZnO thin films fabricated by RF magnetron sputtering
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Author keywords
Hall measurement; P type ZnO; Sb doping; Sputtering
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Indexed keywords
ELECTRIC PROPERTIES;
ELECTRODEPOSITION;
HALL EFFECT;
HOLE CONCENTRATION;
MAGNETIC FIELD EFFECTS;
MAGNETRON SPUTTERING;
MAGNETRONS;
METALLIC FILMS;
OPTICAL FILMS;
OXYGEN;
PHOTODEGRADATION;
RAPID THERMAL ANNEALING;
RAPID THERMAL PROCESSING;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING ZINC COMPOUNDS;
SURFACE ROUGHNESS;
THIN FILM DEVICES;
THIN FILMS;
ZINC OXIDE;
CRYSTAL QUALITIES;
CRYSTALLINITY;
DOPING CONTENTS;
DOPING EFFECTS;
DOPING LEVELS;
ELECTRON CONCENTRATIONS;
GRAIN SIZES;
HALL MEASUREMENT;
HALL-EFFECT MEASUREMENTS;
HIGH TEMPERATURES;
OXYGEN CONTENTS;
P TYPES;
P-TYPE BEHAVIORS;
P-TYPE ZNO;
P-TYPE ZNO THIN FILMS;
RADIO FREQUENCIES;
RF- MAGNETRON SPUTTERING;
SB-DOPED;
SB-DOPING;
SCANNING ELECTRON MICROSCOPES;
SEM;
STRUCTURAL AND ELECTRICAL PROPERTIES;
X- RAY DIFFRACTIONS;
ZNO THIN FILMS;
DOPING (ADDITIVES);
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EID: 60649094086
PISSN: 13853449
EISSN: 15738663
Source Type: Journal
DOI: 10.1007/s10832-007-9393-y Document Type: Article |
Times cited : (21)
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References (14)
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