Crystalline structure of solution-processed pentacene thin films

Synthetic Metals

Volumn 159, Issue 3-4, 2009, Pages 338-342

  Natsume, Y ^a   Minakata, T ^a   Aoyagi, T ^a  

^a ASAHI KASEI CORPORATION   (Japan)

Author keywords

Field effect transistor; In plane XRD; Pentacene; Solution process

Indexed keywords

CRYSTALLINE MATERIALS; FIELD EFFECT TRANSISTORS; SEMICONDUCTING ORGANIC COMPOUNDS; SOLIDS; SURFACE STRUCTURE; THICKNESS MEASUREMENT; THIN FILMS; TRANSISTORS; TWO DIMENSIONAL; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE STRUCTURES; FIELD EFFECT TRANSISTOR; FIELD-EFFECT MOBILITIES; GRAZING INCIDENCES; IN-PLANE STRUCTURES; IN-PLANE XRD; PENTACENE; PENTACENE THIN FILMS; SOLUTION PROCESS; SOLUTION-PROCESSED; TWO-DIMENSIONAL MAPPINGS; X- RAY DIFFRACTIONS;

CRYSTAL STRUCTURE;

EID: 60449088707     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2008.09.007     Document Type: Article

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