Molecular orientation and film morphology of pentacene on native silicon oxide surface

Journal of Physical Chemistry B

Volumn 109, Issue 20, 2005, Pages 9892-9896

  Wang, S D ^a   Dong, X ^a   Lee, C S ^a   Lee, S T ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; EVAPORATION; GROWTH (MATERIALS); MOLECULAR ORIENTATION; MORPHOLOGY; SILICON COMPOUNDS; SURFACES; ULTRAHIGH VACUUM; X RAY DIFFRACTION ANALYSIS;

FILM MORPHOLOGY; FILM THICKNESS; PENTACENE; SILICON OXIDE;

THIN FILMS;

EID: 20344403320     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046490p     Document Type: Article

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