A sequential constant-stress accelerated life testing scheme and its Bayesian inference

Quality and Reliability Engineering International

Volumn 25, Issue 1, 2009, Pages 91-109

  Liu, Xiao ^a   Tang, Loon Ching ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Accelerated life testing; Bayesian inference; Parameter estimation; Sequential method

Indexed keywords

BAYESIAN NETWORKS; INFERENCE ENGINES; KNOWLEDGE BASED SYSTEMS; KNOWLEDGE ENGINEERING; METAL ANALYSIS; PARAMETER ESTIMATION; QUALITY ASSURANCE; RISK ANALYSIS; RISK ASSESSMENT; RISK MANAGEMENT; RISK PERCEPTION; SAFETY ENGINEERING; TESTING;

ACCELERATED LIFE TESTING; ACCELERATED TESTING; ARRHENIUS MODELS; BAYESIAN INFERENCE; CLOSED-FORM EXPRESSIONS; CONSTANT STRESS; DATA ANALYSIS; DATA SETS; ENGINEERING KNOWLEDGE; EXTREME VALUES; HIGH TEMPERATURES; LOCATION PARAMETERS; LOWER STRESS; MODEL PARAMETERS; PRIOR DISTRIBUTIONS; PRIOR KNOWLEDGE; SEQUENTIAL METHOD; STEP BY STEPS; STRESS LEVELS; STRESS LIVES; WEIBULL;

STATISTICAL TESTS;

EID: 60349106002     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.958     Document Type: Article

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