Optimum accelerated life testing plans based on proportional mean residual life

Quality and Reliability Engineering International

Volumn 21, Issue 7, 2005, Pages 701-713

  Zhao, Wenbiao ^a,c,d   Elsayed, Elsayed A ^b,e,f,g  

^a RELIASOFT CORPORATION   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

^c IEEE

^d IEEE ^*

^e RUTGERS UNIVERSITY   (United States)

^f NSF/Industry/University Co operative Research Center   (United States)

^g ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Accelerated life testing; Design of test plans; Proportional mean residual life

Indexed keywords

ACCELERATED LIFE TESTING; ACCELERATED STRESS; DESIGN OF TEST PLANS; PROPORTIONAL MEAN RESIDUAL LIFE;

LIFE CYCLE; REGRESSION ANALYSIS; TESTING;

STRATEGIC PLANNING;

EID: 27744552741     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.709     Document Type: Conference Paper

References (22)

1. Chernoff H. Optimal accelerated life designs for estimation. Technometrics 1962; 4:381-408.
2. Mann NR, Schafer RE, Singpurwalla ND. Methods for Statistical Analysis of Reliability and Life Data. Wiley: New York, 1974.
3. Nelson WB, Kielpinski TJ. Theory for optimum accelerated life tests for normal and lognormal life distributions. Technometrics 1976; 18:105-114.
4. Meeker WQ, Hahn GJ. Optimum allocation schemes for accelerated tests to estimate survival probability at a design stress. TIS Report 76CRD233, General Electric Company Research and Development, 1976.
5. Meeker WQ, Hahn GJ. Asymptotically optimum over-stress tests to estimate the survival probability at a condition with a low expected failure probability. Technometrics 1977; 19:381-399.
6. Meeker WQ, Nelson WB. Optimum accelerated life tests for the Weibull and extreme value distributions. IEEE Transactions on Reliability 1975; 24:321-332.
7. Nelson WB, Meeker WQ. Theory for optimum accelerated censored life tests for Weibull and extreme value distributions. Technometrics 1978; 20:105-114.
8. Meeker WQ. A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring. Technometrics 1984; 26:157-171.
9. Meeker WQ, Hahn GJ. How to plan an accelerated life test-some practical guidelines. Statistical Techniques 1985; 10, ASQC Basic reference in QC.
10. Barton RR. Optimal accelerated life-time plans that minimize the maximum test-stress. IEEE Transactions on Reliability 1991; 40:166-172.
11. Meeter CA, Meeker WQ. Optimum accelerated life tests with a nonconstant scale parameter. Technometrics 1994; 36:71-83.
12. Escobar LA, Meeker WQ. Planning accelerated life tests with two or more experimental factors. Technometrics 1995; 37:411-427.
13. Park JW, Yum BJ. Optimal design of accelerated life tests with two stresses. Naval Research Logistics 1996; 43:863-884.
14. Park SJ, Yum BJ, Balamurali S. Optimal design of step-stress degradation tests in the case of destructive measurement. Quality Technology and Quantitative Management 2004; 1:105-124.
15. Jiao LX. Optimal allocations of stress levels and test units in accelerated life tests. PhD Dissertation, Department of Industrial and Systems Engineering, Rutgers University, 2001.
16. Elsayed EA, Jiao L. Optimal design of proportional hazards based accelerated life testing plans. International Journal of Materials and Product Technology 2002; 17:411-424.
17. Cox DR. Regression models and life tables (with discussion). Journal of the Royal Statistical Society B 1972; 34:187-220.
18. Oakes D, Dasu T. A note on residual life. Biometrika 1990; 77:409-410.
19. Box MJ. A new method of constrained optimization and a comparison with other methods. The Computer Journal 1965; 8:42-52.
20. Wright MH. Direct search methods: Once scorned now respectable. Numerical Analysis 1995 (Proceedings of the 1995 Dundee Biennial Conference in Numerical Analysis), Griffiths DF, Watson GA. (eds.). Addison-Wesley Longman: Reading, MA, 1996; 191-208.
21. Neider JA, Mead RA. Simplex method for function minimization. The Computer Journal 1965; 7:308-313.
22. Elsayed EA. Reliability Engineering. Addison-Wesley Longman: Reading, MA, 1996.