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Volumn 17, Issue 1, 2001, Pages 11-18

Inference method for temperature step-stress accelerated life testing

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; FAILURE ANALYSIS; GRAPHIC METHODS; MAXIMUM LIKELIHOOD ESTIMATION; MECHANICAL TESTING;

EID: 0034824120     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.362     Document Type: Article
Times cited : (33)

References (15)
  • 1
    • 0019026625 scopus 로고
    • Accelerated life testing - Step-stress model and data analysis
    • Nelson W. Accelerated life testing - step-stress model and data analysis. IEEE Transactions on Reliability 1980; 29:103-108.
    • (1980) IEEE Transactions on Reliability , vol.29 , pp. 103-108
    • Nelson, W.1
  • 2
    • 0020734526 scopus 로고
    • Optimum simple step-stress plans for accelerated life testing
    • Miller R, Nelson W. Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability 1983; 32:59-65.
    • (1983) IEEE Transactions on Reliability , vol.32 , pp. 59-65
    • Miller, R.1    Nelson, W.2
  • 3
    • 0024891878 scopus 로고
    • Optimum simple step-stress accelerated life tests with censoring
    • Bai DS, Kim MS, Lee SH. Optimum simple step-stress accelerated life tests with censoring. IEEE Transactions on Reliability 1989; 38:528-532.
    • (1989) IEEE Transactions on Reliability , vol.38 , pp. 528-532
    • Bai, D.S.1    Kim, M.S.2    Lee, S.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.