Planning Accelerated Life Tests for Censored Two-Parameter Exponential Distributions

Naval Research Logistics

Volumn 46, Issue 2, 1999, Pages 169-186

  Tang, L C ^a   Goh, T N ^a   Sun, Y S ^a   Ong, H L ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; PARAMETER ESTIMATION;

TWO-PARAMETER EXPONENTIAL DISTRIBUTIONS;

DECISION MAKING;

EID: 0033101566     PISSN: 0894069X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1520-6750(199903)46:2<169::AID-NAV3>3.0.CO;2-U     Document Type: Article

References (16)

1. D. S. Bai and M. S. Kim, Optimum single step-stress accelerated life tests for Weibull distribution and type I censoring, Naval Res Logistics Quart 40 (1993), 193-210.
2. D. S. Bai and Y. R. Chun, Optimum simple step-stress accelerated life-tests with competing cause of failure, IEEE Trans Reliability R-40 (1991), 622-627.
3. D. S. Bai, M. S. Kim, and S. H. Lee, Optimum simple step-stress accelerated life tests with censoring, IEEE Trans Reliability R-38 (1989), 528-532.
4. H. Chernoff, Optimal accelerated life designs for estimation, Technometrics 4 (1962), 381-408.
5. B. Epstein and M. Sobel, Some theorems relevant to life testing from an exponential distribution, Ann Math Stat 25 (1954), 373-381.
6. R. E. Little and E. H. Jebe, A note on the gain in precision for optimal allocation in regression as applied to extrapolation in S-N fatigue testing, Technometrics 11 (1969), 389-392.
7. N. R. Mann, Design of overstress life-test experiments when failure times have a two-parameter Weibull distribution, Technometrics 14 (1972), 437-451.
8. W. Q. Meeker and W. Nelson, Optimal censored accelerated tests for Weibull and extreme value distributions and censored data, IEEE Trans Reliability R-24 (1975), 321-332.
9. R. Miller and W. Nelson, Optimum simple step-stress plans for accelerated life testing, IEEE Trans Reliability R-32 (1983), 59-65.
10. A. M. Mood, F. A. Graybill, and D. C. Boes, Introduction to the theory of statistics, McGraw-Hill, New York, 1974.
11. W. Nelson and T. J. Kielpinski, Optimal accelerated life tests for normal and lognormal life distributions, IEEE Trans Reliability R-24 (1975), 310-320.
12. W. Nelson and T. J. Kielpinski, Theory for optimal censored accelerated tests for normal and lognormal life distributions, Technometrics 18 (1976), 105-114.
13. W. Nelson and W. Q. Meeker, Theory for optimal accelerated censored life tests for Weibull and extreme value distributions, Technometrics 20 (1978), 171-177.
14. W. Nelson, Accelerated life testing - step-stress models and data analysis, IEEE Trans Reliability R-29 (1980), 103-108.
15. H. Sandoh and S. Fujii, Designing an optimal life test with type I censoring, Naval Res Logistics Quart 38 (1991), 23-31.
16. Y. S. Sun, M. Xie, T. N. Goh, and H. L. Ong, Development and applications of a three-parameter Weibull distribution with load-dependent location and scale parameters, Reliability Eng Syst Safety 40 (1993), 133-137.