Resistance transition in metal oxides induced by electronic threshold switching

Applied Physics Letters

Volumn 94, Issue 6, 2009, Pages

  Ielmini, D ^a   Cagli, C ^a   Nardi, F ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; DISPLAY DEVICES;

DISORDERED SEMICONDUCTORS; ELECTRICAL MEASUREMENTS; ELECTRICAL PULSE; ELECTRONIC TRANSITIONS; LOW RESISTANCES; MEMORY DEVICES; METAL OXIDES; NUMERICAL SIMULATIONS; PARASITIC CAPACITANCES; SUBNANOSECOND TRANSITIONS; THRESHOLD SWITCHING; TIME-RESOLVED;

SWITCHING;

EID: 60349087905     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3081401     Document Type: Article

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