Imaging the electrical conductance of individual carbon nanotubes with photothermal current microscopy

Nature Nanotechnology

Volumn 4, Issue 2, 2009, Pages 108-113

  Tsen, Adam W ^a   Donev, Luke A K ^b   Kurt, Huseyin ^c   Herman, Lihong H ^a   Park, Jiwoong ^d  

^a Cornell University   (United States)

^b Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

^c HARVARD UNIVERSITY   (United States)

^d Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; ELECTRIC CONDUCTANCE;

CHARACTERIZATION TECHNIQUES; ELECTRICAL CHARACTERIZATION; ELECTRICAL CONDUCTANCE; NANOTUBE TRANSISTORS; ONE-DIMENSIONAL STRUCTURE; OPTICAL AND ELECTRICAL PROPERTIES; SPATIALLY RESOLVED; TEMPERATURE CHANGES;

YARN;

CARBON NANOTUBE; NANOMATERIAL;

ARTICLE; ELECTRIC CONDUCTIVITY; LASER; MICROSCOPY; MOLECULAR ELECTRONICS; MOLECULAR MECHANICS; NANOARRAY; NANOIMAGING; PHOTOTHERMAL CURRENT MICROSCOPY; PRIORITY JOURNAL; SEMICONDUCTOR; SURFACE PROPERTY; THERMAL CONDUCTIVITY;

EID: 59849101535     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2008.363     Document Type: Article

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