Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence-X-ray Absorption Near Edge Structure analysis of arsenic

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 63, Issue 12, 2008, Pages 1496-1502

  Meirer, F ^a   Pepponi, G ^b   Streli, C ^a   Wobrauschek, P ^a   Kregsamer, P ^a   Zoeger, N ^a   Falkenberg, G ^c  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b FONDAZIONE BRUNO KESSLER   (Italy)

^c DESY   (Germany)

Author keywords

Arsenic; Self absorption; TXRF; XANES

Indexed keywords

ABSORPTION; ABSORPTION SPECTRA; ARSENIC; CHEMICAL ELEMENTS; CHEMICAL SPECIATION; DAMPING; ELECTRODEPOSITION; ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVE REFLECTION; ENERGY ABSORPTION; FLUORESCENCE; LIGHT ABSORPTION; LITHIUM COMPOUNDS; MOTION ESTIMATION; TRACE ANALYSIS; TRACE ELEMENTS; X RAY ABSORPTION; X RAYS;

A-PRIORI; CONFOCAL WHITE LIGHT MICROSCOPIES; ELEMENT LEVELS; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FLAT SUBSTRATES; GRAZING INCIDENCES; INCIDENT BEAMS; KEY PARAMETERS; MONTE-CARLO SIMULATIONS; PARAMETER STUDIES; SAMPLE SHAPES; SELF-ABSORPTION; SELF-ABSORPTION EFFECTS; STANDARD SOLUTIONS; THEORETICAL CALCULATIONS; TOTAL MASS; TOTAL REFLECTIONS; TXRF; TXRF-XANES; X RAY ABSORPTION NEAR-EDGE STRUCTURES; X-RAY ABSORPTIONS; XANES; XANES MEASUREMENTS;

X RAY ANALYSIS;

EID: 59349088236     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2008.05.004     Document Type: Article

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