Temperature-dependent phase segregation in Cu/42Sn-58Bi/Cu reaction couples under high current density

Journal of Electronic Materials

Volumn 38, Issue 2, 2009, Pages 273-283

  Xu, Guangchen ^a   He, Hongwen ^a   Guo, Fu ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Electromigration; Eutectic Sn Bi; Joule heating

Indexed keywords

ANODE SIDES; AVERAGE SIZES; DIMENSIONAL STRUCTURES; HIGH CURRENT DENSITIES; HIGH TEMPERATURES; LOW TEMPERATURES; MASS FLOWS; MIXED STRUCTURES; PHASE SEGREGATIONS; RICH PHASE; SCANNING ELECTRONS; TEMPERATURE DEPENDENCES;

ELECTRIC CURRENTS; EUTECTICS; HEATING; JOULE HEATING; PHASE SEPARATION; SCANNING ELECTRON MICROSCOPY; TIN;

ELECTROMIGRATION;

EID: 58349101281     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-008-0562-9     Document Type: Article

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