Probing electrical transport in individual carbon nanotubes and junctions

Nanotechnology

Volumn 19, Issue 48, 2008, Pages

  Kim, Tae Hwan ^a   Wendelken, John F ^a   Li, An Ping ^a   Du, Gaohui ^b   Li, Wenzhi ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b FLORIDA INTERNATIONAL UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTICS; CURRENT VOLTAGE CHARACTERISTICS; GRAPHITE; NANOCOMPOSITES; NANOTUBES; TRANSPORT PROPERTIES;

BALLISTIC TRANSPORTS; CATALYTIC PARTICLES; CONE ANGLES; DIFFUSIVE TRANSPORTS; ELECTRICAL TRANSPORT PROPERTIES; ELECTRICAL TRANSPORTS; GRAPHITE SHEETS; JUNCTION AREAS; LAYER INTERACTIONS; LINEAR CURRENTS; SCATTERING CENTERS; STRAIGHT SEGMENTS; STRUCTURAL DEFORMATIONS; TUNNELING MICROSCOPES; V CURVES;

CARBON NANOTUBES;

CARBON NANOTUBE; GRAPHITE;

ARTICLE; CATALYST; ELECTRIC POTENTIAL; ELECTRON TRANSPORT; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; TRANSPORT KINETICS;

EID: 58149248054     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/48/485201     Document Type: Article

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