Intrinsic electron transport properties of carbon nanotube Y-junctions

Applied Physics Letters

Volumn 81, Issue 27, 2002, Pages 5234-5236

  Meunier, Vincent ^a   Nardelli, Marco Buongiorno ^a,b   Bernholc, J ^a,b   Zacharia, Thomas ^a   Charlier, Jean Christophe ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; ELECTRONIC DENSITY OF STATES; HAMILTONIANS; INTERFACES (MATERIALS); SEMICONDUCTOR JUNCTIONS;

NANOTUBE-METAL INTERFACES;

CARBON NANOTUBES;

EID: 0041953473     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1533842     Document Type: Article

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