A literature review of IGBT fault diagnostic and protection methods for power inverters

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn , Issue , 2008, Pages

  Lu, Bin ^a   Sharma, Santosh ^a  

^a EATON CORPORATION   (United States)

Author keywords

Fault diagnosis; Gate misfiring fault; IGBT; Open circuit fault; Power inverter; Short circuit fault

Indexed keywords

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

FAULT DIAGNOSIS; GATE-MISFIRING FAULT; IGBT; OPEN-CIRCUIT FAULT; POWER INVERTER; SHORT-CIRCUIT FAULT;

ACTIVE FILTERS;

EID: 57949108250     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/08IAS.2008.349     Document Type: Conference Paper

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