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Volumn 2, Issue , 2003, Pages 1733-1738

A Novel Protection Technique Devoted to the Improvement of the Short Circuit Ruggedness of IGBTs

Author keywords

[No Author keywords available]

Indexed keywords

GATE RESISTANCE; GATE-EMITTER CAPACITANCE;

EID: 1442353370     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2003.1280319     Document Type: Conference Paper
Times cited : (21)

References (8)
  • 1
    • 0028464087 scopus 로고
    • Investigation of Fault Modes of Voltage Fed Inverter system for Induction Motor Drive
    • July-August
    • D. Kastha, B. K. Bose, "Investigation of Fault Modes of Voltage Fed Inverter system for Induction Motor Drive," IEEE Transaction on Industry Applications, July-August. 1994, Vol. 30, No. 4, pp. 1028-1038.
    • (1994) IEEE Transaction on Industry Applications , vol.30 , Issue.4 , pp. 1028-1038
    • Kastha, D.1    Bose, B.K.2
  • 2
    • 0029270841 scopus 로고
    • Short Circuit Behavior of IGBT's Correlated to the Intrinsic Device Structure and on the Application Circuit
    • March-April
    • R. Letor, G. C. Aniceto, "Short Circuit Behavior of IGBT's Correlated to the Intrinsic Device Structure and on the Application Circuit," IEEE Transactions on Industry Applications, Vol. 31, No. 2, March-April. 1995, pp. 234-239.
    • (1995) IEEE Transactions on Industry Applications , vol.31 , Issue.2 , pp. 234-239
    • Letor, R.1    Aniceto, G.C.2
  • 5
    • 0027881954 scopus 로고
    • Optimization of the Turn-off Performance of IGBT at Overcurrent and Short-circuit Current
    • H. G. Eckel and L. Sack, "Optimization of the Turn-off Performance of IGBT at Overcurrent and Short-circuit Current," in Proc. EPE Conf., 1993, vol. 2, pp. 317-322.
    • (1993) Proc. EPE Conf. , vol.2 , pp. 317-322
    • Eckel, H.G.1    Sack, L.2
  • 7
    • 0036443295 scopus 로고    scopus 로고
    • A New Gate Circuit Performing Fault Protections of IGBTs During Short Circuit Transients
    • October, Pittsburgh, USA
    • G. Belverde, M. Melito, S. Musumeci, R. Pagano, A. Raciti, "A New Gate Circuit Performing Fault Protections of IGBTs During Short Circuit Transients," Conference Record of the 37th IAS Annual Meeting, October 2002, Pittsburgh, USA, vol. 4, pp. 2614-2621.
    • (2002) Conference Record of the 37th IAS Annual Meeting , vol.4 , pp. 2614-2621
    • Belverde, G.1    Melito, M.2    Musumeci, S.3    Pagano, R.4    Raciti, A.5
  • 8
    • 0032187647 scopus 로고    scopus 로고
    • Electrothermal Simulations in Punch Through and non Punch Through IGBT's
    • October
    • S. Pendharkar, M. Trivedi, K. Shenai, "Electrothermal Simulations in Punch Through and non Punch Through IGBT's," IEEE Transactions on Electron Devices, Vol. 45, No. 10, October 1998, pp. 2222-2231.
    • (1998) IEEE Transactions on Electron Devices , vol.45 , Issue.10 , pp. 2222-2231
    • Pendharkar, S.1    Trivedi, M.2    Shenai, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.