IGBT behavior during Desat detection and short circuit fault protection

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1998, Pages 245-248

  Bhalla, A ^a   Shekhawat, S ^a   Gladish, J ^a   Yedinak, J ^a   Dolny, G ^a  

^a INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC POTENTIAL; GATES (TRANSISTOR); SHORT CIRCUIT CURRENTS; WAVEFORM ANALYSIS;

INSULATED GATED BIPOLAR TRANSISTOR (IGBT);

BIPOLAR TRANSISTORS;

EID: 0031634390     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)