Infrared spectroscopy of the interface charge in a ZnO field-effect transistor

Applied Physics Letters

Volumn 93, Issue 24, 2008, Pages

  Kim, Jooyoun ^a   Jung, Sunghoon ^a   Choi, E J ^a   Kim, Kitae ^b   Lee, Kimoon ^b   Im, Seongil ^b  

^a University of Seoul   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CIVIL AVIATION; FIELD EFFECT TRANSISTORS; HEAT CONDUCTION; INFRARED SPECTROSCOPY; SCATTERING; SEMICONDUCTING ZINC COMPOUNDS; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; TRANSISTORS; ZINC OXIDE;

CHANNEL CONDUCTIONS; DRUDE MODELS; INFRARED TRANSMISSION SPECTROSCOPIES; INTERFACE CHARGES; MICROSCOPIC SCATTERINGS; SOURCE VOLTAGES;

CHARGE CARRIERS;

EID: 57849165468     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3049604     Document Type: Article

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