Infrared spectroscopy on the charge accumulation layer in rubrene single crystals

Applied Physics Letters

Volumn 89, Issue 18, 2006, Pages

  Fischer, Matthias ^a   Dressel, Martin ^a   Gompf, Bruno ^a   Tripathi, Ashutosh K ^a   Pflaum, Jens ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; ELECTROMAGNETIC WAVE SCATTERING; FIELD EFFECT TRANSISTORS; INFRARED SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS;

CHARGE MODULATION SPECTROSCOPY; DRUDE RESPONSE; INTRINSIC TRANSPORT PARAMETERS; SCATTERING RATE;

SINGLE CRYSTALS;

EID: 33750713684     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2370743     Document Type: Article

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