Microstructure of sol-gel derived TiO2 thin films characterized by atmospheric ellipsometric porosimetry

Thin Solid Films

Volumn 517, Issue 5, 2009, Pages 1596-1600

  Bockmeyer, Matthias ^a   Herbig, Bettina ^a   Löbmann, Peer ^a  

^a FRAUNHOFER INSTITUTE FOR SILICATE RESEARCH ISC   (Germany)

Author keywords

Ellipsometry; Photocatalytic activity; Sol gel; Thin films; TiO2; Titania

Indexed keywords

ADSORPTION; ATMOSPHERICS; CRACKS; ELLIPSOMETRY; GAS ADSORPTION; GELATION; GELS; PHOTOCATALYSIS; PHOTODEGRADATION; SOL-GEL PROCESS; SOL-GELS; SOLS; SURFACE DEFECTS; THICK FILMS; THIN FILMS; TITANIUM DIOXIDE; TITANIUM OXIDES; WATER VAPOR;

ADSORPTION OF WATERS; ELLIPSOMETRIC MEASUREMENTS; ELLIPSOMETRIC POROSIMETRY; IN-SITU; MICROSTRUCTURAL CHARACTERIZATIONS; PERMEABLE SURFACES; PHOTOCATALYTIC ACTIVITY; PHOTOCATALYTIC DEGRADATIONS; SOL-GEL; TIO2; TITANIA;

COLLOIDS;

EID: 56949093969     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.09.079     Document Type: Article

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