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Volumn 18, Issue 47, 2008, Pages 5753-5760
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Highly resilient field emission from aligned single-walled carbon nanotube arrays chemically attached to n-type silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARBON NANOTUBES;
CYCLIC VOLTAMMETRY;
FIELD EMISSION;
FIELD EMISSION DISPLAYS;
MICROSCOPIC EXAMINATION;
NANOCOMPOSITES;
NANOSTRUCTURED MATERIALS;
NANOSTRUCTURES;
NANOTUBES;
SEMICONDUCTING SILICON;
SILICON;
ATOMIC FORCES;
CHEMICAL ATTACHMENTS;
CONSTANT CURRENTS;
FIELD EMITTERS;
FIELD ENHANCEMENT FACTORS;
HIGH DENSITIES;
SI SURFACES;
VERTICALLY ALIGNED;
SINGLE-WALLED CARBON NANOTUBES (SWCN);
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EID: 56849121401
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/b811546j Document Type: Article |
Times cited : (21)
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References (49)
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