메뉴 건너뛰기




Volumn 18, Issue 47, 2008, Pages 5753-5760

Highly resilient field emission from aligned single-walled carbon nanotube arrays chemically attached to n-type silicon

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CYCLIC VOLTAMMETRY; FIELD EMISSION; FIELD EMISSION DISPLAYS; MICROSCOPIC EXAMINATION; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTUBES; SEMICONDUCTING SILICON; SILICON;

EID: 56849121401     PISSN: 09599428     EISSN: 13645501     Source Type: Journal    
DOI: 10.1039/b811546j     Document Type: Article
Times cited : (21)

References (49)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.