Characterization of the field emission properties of individual thin carbon nanotubes

Applied Physics Letters

Volumn 85, Issue 9, 2004, Pages 1607-1609

  De Jonge, Niels ^a   Allioux, Myriam ^a,c   Doytcheva, Maya ^a   Kaiser, Monja ^a   Teo, Kenneth B K ^b   Lacerda, Rodrigo G ^b   Milne, William I ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CURRENT DENSITY; ELECTRIC FIELD EFFECTS; ELECTRON TUNNELING; PHOSPHORS; SILICON; SUBSTRATES;

BOLTZMANN CONSTANT; ELECTRON CHARGE; FIELD EMISSION PROPERTIES; FOWLER-NORDHEIM BEHAVIOR;

CARBON NANOTUBES;

EID: 4944225398     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1786634     Document Type: Article

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