Twinning, dislocations and grain size in nanoSPD materials determined by X-ray diffraction

Materials Science Forum

Volumn 584-586 PART 1, Issue , 2008, Pages 571-578

  Ungár, Tamás ^a   Balogh, Levente ^a   Ribárik, Gábor ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

Crystallite size; Dislocations; Nanomaterials; SPD; Stacking faults; Twinning; X ray line profile analysis

Indexed keywords

CRYSTALLITE SIZE; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; STACKING FAULTS; TWINNING; X RAY DIFFRACTION;

DIFFERENT EFFECTS; DISLOCATION DENSITIES; HIGH RESOLUTION; LINE BROADENING; PROFILE FUNCTIONS; SEVERE PLASTIC DEFORMATIONS; SYSTEMATIC ANALYSIS; X-RAY LINE PROFILE ANALYSIS;

DISLOCATIONS (CRYSTALS);

EID: 56349141611     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.584-586.571     Document Type: Conference Paper

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