Grain orientation effects in Zr702α polycrystalline samples deformed in channel die compression at room temperature

Acta Materialia

Volumn 46, Issue 12, 1998, Pages 4131-4142

  Francillette, H ^a   Bacroix, B ^a   Gasperini, M ^a   Bechade, J L ^b  

^a UNIVERSITÉ PARIS 13   (France)

^b SRMA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; DEFORMATION; ELECTRON DIFFRACTION; ELECTRON SCATTERING; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; POLYCRYSTALLINE MATERIALS; STRAIN; STRESS ANALYSIS; TEXTURES; TWINNING;

CHANNEL DIE COMPRESSION; ELECTRON BACKSCATTERING DIFFRACTION (EBSD); SLIP TRACE ANALYSIS;

ZIRCONIUM;

EID: 0032108996     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00121-9     Document Type: Article

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