A hybrid prognostics methodology for electronic products

Proceedings of the International Joint Conference on Neural Networks

Volumn , Issue , 2008, Pages 3479-3485

  Kumar, Sachin ^a   Torres, Myra ^a   Chan, Y C ^b   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRONICS INDUSTRY; HEALTH; THEOREM PROVING;

CASE STUDIES; CIRCUIT ASSEMBLIES; ELECTRONIC PRODUCTS; ENVIRONMENTAL CONDITIONS; FAILURE MECHANISMS; FAULT DIAGNOSIS; HEALTH STATUSES; HISTORICAL PERFORMANCES; HYBRID APPROACHES; HYBRID METHODOLOGIES; IN-SITU; LIFE PREDICTIONS; NORMAL OPERATING CONDITIONS; PERFORMANCE DEGRADATIONS; PHYSICS OF FAILURES; PROGNOSTICS AND HEALTH MANAGEMENTS; SHORT-COMINGS;

NEURAL NETWORKS;

EID: 56349101814     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IJCNN.2008.4634294     Document Type: Conference Paper

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